Electronic calibration of focal spot position in an X-ray tube

ABSTRACT

Technology is described for calibrating a deflected position of a central ray of an x-ray tube to a radiation imager. An x-ray system includes an x-ray tube and a tube control unit (TCU). The x-ray tube includes a cathode that includes an electron emitter configured to emit an electron beam, an anode configured to receive the electron beam and generate x-rays with a central ray from electrons of the electron beam colliding on a focal spot of the anode, and a steering magnetic multipole between the cathode and the anode that is configured to produce a steering magnetic field from a steering signal. At least two poles of the steering magnetic multipole are on opposite sides of the electron beam. The TCU includes at least one steering driver configured to generate the steering signal. The TCU is configured to convert a position correction value to the steering signal.

BACKGROUND

Unless otherwise indicated herein, the approaches described in thissection are not prior art to the claims in this disclosure and are notadmitted to be prior art by inclusion in this section.

An x-ray system typically includes an x-ray tube and an imager (ordetector). The power and signals for the x-ray tube can be provided by ahigh voltage generator. The x-ray tube emits radiation, such as x-rays,toward an object. The object is positioned between the x-ray tube andthe imager. The radiation typically passes through the object andimpinges on the imager. As radiation passes through the object, internalstructures of the object cause attenuation in the radiation received atthe imager. The imager then generates data based on the detectedradiation, and the system translates or reconstructs the radiationattenuations into an image with spatial variances, which may be used toevaluate the internal structure of the object, such as a patient in amedical imaging procedure or an inanimate object in an inspection scan.

The x-ray tube includes a cathode and an anode. X-rays are produced inx-ray tubes by applying an electrical current to a filament positionedwithin the cathode to cause electrons to be emitted from the cathode bythermionic emission. In a vacuum, the electrons accelerate towards andthen impinge upon the anode due to the voltage difference between thecathode and the anode. When the electrons collide with a target on theanode, some of the energy is emitted as x-rays, and the majority of theenergy is released as heat. The area on the anode in which the electronscollide is generally known as the focal spot, and the emitted x-rays canhave a central ray (i.e., central ray beam, central x-ray beam, centerray beam, center x-ray beam, or center ray) emanating from the focalspot, and the central ray represents a point area in x-ray beam with ahigh intensity. A focal spot size can be determined by an x-ray systemdesign, an x-ray tube structure, a tube voltage (e.g., with units ofkilovolts [kV]), and a tube current (e.g., with units of milliamps[mA]). Because of high temperatures generated when the electron beamstrikes the target, specifically the focal spot, the anode can includefeatures to distribute the heat generated at the focal spot on thetarget, such as rotating a disc-shaped anode target at a high rotationalspeed. A rotating anode typically includes the disc-shaped anode target,which is rotated by an induction motor via a bearing assembly.

The radiation imager (e.g., x-ray detector, x-ray imager, or radiationdetector) can include a conversion element that converts an incomingradiation beam into electrical signals, which can be used to generatedata about the radiation beam, which in turn can be used to characterizean object being inspected (e.g., the patient or inanimate object). Inone example, the conversion element includes a scintillator thatconverts a radiation beam into light, and a sensor that generateselectrical signals in response to the light. The imager can also includeprocessing circuitry that processes the electrical signals to generatedata about the radiation beam.

The x-ray tube and radiation imager can be components in an x-raysystem, such as a computed tomography (CT) system or scanner, whichincludes a gantry that rotates both the x-ray tube and the imager togenerate various images of the object at different angles. The CTscanner may also include a collimator to limit the exposure area of theemitted x-rays. A collimator is a device that narrows a beam ofparticles or waves (e.g., x-rays) to cause the directions of the beam tobecome more aligned in a specific direction or to cause the spatialcross section of the beam to become smaller. The x-ray tube, theradiation imager, the collimator, and the generator can be separatecomponents that are attached to the gantry.

Based on the object being imaged (e.g., specific patient anatomy) andthe position of the object relative to the x-ray tube and radiationimager, the central ray generated by the x-ray tube can be moved,deflected, or steered to different positions on the radiation imager toprovide better image resolution of the object. The focal spot size orother minor distortions can occur from the different deflectionpositions.

The technology (systems, devices, and methods) described herein can beused to modify the focal spot size and position for the differentdeflection positions of the central ray.

BRIEF SUMMARY OF SOME EXAMPLE EMBODIMENTS

Electronic calibration of focal spot position (or central ray position)or electronic calibration of focal spot size (or central ray intensityor x-ray beam energy distribution) refers to the technology (systems,devices, and methods) described herein that provides adjustments,especially for fine tune adjustments, of the central ray for differentdeflection or steering positions and the x-ray beam power levels atthose different deflection or steering positions.

Electronic calibration of focal spot position or electronic calibrationof focal spot size can provide a focal spot size that can be adjusted touniform size over an entire dynamic range of tube voltages (e.g., withunits of kilovolts [kV]) and tube currents (e.g., with units ofmilliamps [mA]) as well as provide position adjustments due tocurvatures in the components of the x-ray system (e.g., the disc-shapedanode target or the curved imager of a CT scanner). These adjustments ina manual or automated mode allow fine adjustment of the electron beam tocorrect for aperture errors and other deflection errors due to curvatureon the imager, which can improve image resolution, the signal to noiseratio, and image quality.

In an example, a method is provided for calibrating a deflected positionof a central ray of an x-ray tube to a radiation imager using a tubecontrol unit (TCU). The method includes the operation of emittingelectrons from an emitter in an x-ray tube. The next operation of themethod can include deflecting the beam of electrons with a steeringmagnetic multipole between the emitter and an anode on the x-ray tubeaccording to a specified deflection position. The method can furtherinclude generating x-rays with a central ray from the electronscolliding on a focal spot of an anode of the x-ray tube. The nextoperation of the method can include receiving, at the TCU, a positioncorrection value representing a distance of a deflected central ray fromthe specified deflection position. The method can further includegenerating a steering signal from at least one steering driver of theTCU based on the position correction value that is applied to thesteering magnetic multipole. The next operation of the method caninclude moving the focal spot on the anode with the steering magneticmultipole so the deflected central ray aligns with the specifieddeflection position. At least two poles of the steering magneticmultipole are on opposite sides of a path of the electrons.

In an example, the operation of generating the steering signal includes:summing steering position calibration data and the position correctionvalue, and combining the sum of the steering position calibration dataand the position correction value with steering driver calibration data.The steering position calibration data represent current values togenerate at least one steering position using the steering magneticmultipole for a tube voltage and tube current combination. Each steeringposition has an associated position correction value for the tubevoltage and tube current combination. The steering position calibrationdata represent current values of the at least one steering driver.

In another example, the operation of generating the steering signalincludes: summing steering position calibration data, the positioncorrection value, and an offset value, and combining the sum of thesteering position calibration data, the position correction value, andthe offset value with steering driver calibration data. The offset valuerepresents a distance of the central ray from a specified imagerlocation for a tube voltage and tube current combination. The at leastone steering position is oriented from the specified imager location.

In another example, the operation of generating the steering signalincludes: determining a position change of the central ray differentfrom at least one steering position, calculating an interpolateddeflection value using the steering position calibration data for atleast two steering positions, calculating an interpolated positioncorrection value using position correction values for the at least twosteering positions, and summing the interpolated deflection valuerepresenting a deflected position of the central ray and theinterpolated position correction value representing the positioncorrection value of the position change of the central ray. The methodcan further include saving each position correction value in a positioncorrection table.

In a configuration, the method can further include generating a focusingsignal from at least one focus driver of the TCU that is applied to afocusing magnetic multipole between the emitter and the anode on thex-ray tube, and narrowing an area of the focal spot on the anode withthe focusing magnetic multipole. The operation of generating thefocusing signal can further include: receiving tube calibration datafrom the x-ray tube, and combining the tube calibration data and focusdriver calibration data. The tube calibration data represent currentvalues to generate a specified focal spot size for the x-ray tube. Thefocus driver calibration data represent the current values of at leastone focus driver. Prior to generating the focusing signal, in anotherconfiguration, the method can further include receiving, at the TCU, asize correction value representing an x-ray intensity difference betweenthe deflected central ray and the central ray at a specified referenceposition. The method can further include saving each size correctionvalue in a size correction table. Prior to combining the tubecalibration data and the focus driver calibration data, in anotherconfiguration, the method can further include summing tube calibrationdata and a size correction value. The tube calibration data representcurrent values to generate a specified focal spot size using thefocusing magnetic multipole for a tube voltage and tube currentcombination. The size correction value represents current changes forthe specified focal spot size associated with the specified deflectionposition for the tube voltage and tube current combination. Theoperation of combining the tube calibration data and the focus drivercalibration data can further include combining the sum of the tubecalibration data and the size correction value with the focus drivercalibration data.

Prior to receiving the position correction value, in another example,the method can further include: receiving, at a system control unit,image data from a radiation imager including a central ray position onthe radiation imager, calculating the position correction value based onthe central ray position relative to the specified deflection position,and sending the position correction value to the TCU. Also prior toreceiving the position correction value, the method can further include:detecting x-rays, converting detected x-rays into image data thatincludes a central ray position, and sending the image data to thesystem control unit.

In another example, an x-ray system includes an x-ray tube and a tubecontrol unit (TCU). The x-ray tube includes a cathode that includes anelectron emitter configured to emit an electron beam, an anodeconfigured to receive the electron beam and generate x-rays with acentral ray from electrons of the electron beam colliding on a focalspot of the anode, and a steering magnetic multipole between the cathodeand the anode that is configured to produce a steering magneticmultipole field from a steering signal. At least two poles of thesteering magnetic multipole are on opposite sides of the electron beam.The steering magnetic field moves a focal spot of the electron beam onthe anode. The TCU includes at least one steering driver configured togenerate the steering signal. The TCU is configured to convert aposition correction value to the steering signal. The positioncorrection value represents a distance of a deflected central ray from aspecified deflection position.

In a configuration, the steering magnetic multipole has a steering yokewith at least two evenly distributed pole projections extending from thesteering yoke and oriented toward a central axis of the steering yoke.Each of the at least two pole projections having a steeringelectromagnetic coil operably coupled to the at least one steeringdriver that provides a current to each steering electromagnetic coil toproduce a steering magnetic field.

In another configuration, the steering magnetic multipole includes atleast two sets of steering magnetic dipoles that provides twodimensional (2D) steering of the focal spot. A first set of the steeringmagnetic dipoles include two poles on opposite sides of the electronbeam and a second set of the steering magnetic dipoles include anothertwo poles on opposite sides of the electron beam. A first path ofmagnetic flux from between the two poles of the first set of thesteering magnetic dipoles is at an angle to a second path of magneticflux from between the two poles of the second set of the steeringmagnetic dipoles. The at least one steering driver includes at least onefirst axis driver configured to generate the steering signal to the twopoles and at least one second axis driver configured to generate thesteering signal to the other two poles.

In another example, the steering magnetic multipole includes two sets ofsteering magnetic dipoles that have a steering yoke with four evenlydistributed steering pole projections extending from the steering yokeand oriented toward a central axis of the steering yoke. Each of thefour steering pole projections having a steering electromagnetic coiloperably coupled to the at least one steering driver that provides acurrent to each steering electromagnetic coil to produce a steeringmagnetic field.

In another configuration, the x-ray tube includes a focusing magneticmultipole between the cathode and the steering magnetic multipole thatis configured to produce a focusing magnetic field from a focusingsignal. The focusing magnetic field narrows the electron beam on a focaltrack of the anode. The TCU includes at least one focus driverconfigured to generate the focusing signal. The TCU can be furtherconfigured to convert a size correction value to the focusing signal.The size correction value represents an x-ray intensity differencebetween the deflected central ray and the central ray at a specifiedreference position. The size correction value is associated with thespecified deflection position for a tube voltage and tube currentcombination. The TCU can also include focus driver calibration datarepresenting current values of at least one focus driver. The focusingsignal can include the focus driver calibration data partially iteratedwith a sum of the size correction value and tube calibration data. Thetube calibration data represent current values to generate a specifiedfocal spot size for the x-ray tube for the tube voltage and tube currentcombination. In another example, the focusing magnetic multipole isdisposed on the steering magnetic multipole. The steering magneticmultipole is also configured to produce a focusing magnetic field.

In another example, the TCU includes: steering driver calibration datarepresenting current values of the at least one steering driver, andsteering position calibration data representing current values togenerate at least one steering position using the steering magneticmultipole for a tube voltage and tube current combination. The steeringsignal includes the steering position calibration data for the specifieddeflection position added to the position correction value for thespecified deflection position and is partially iterated with thesteering driver calibration data. The steering position calibration datacan include multiple steering positions in which other steeringpositions can be calculated.

In an example, the x-ray system includes a system control unitconfigured to: receive image data from a radiation imager that includesa central ray position, calculate the offset value based on the centralray position relative to the specified imager location, and send theoffset value to the TCU. In another example, the x-ray system includesan x-ray imager configured to: detect x-rays, convert detected x-raysinto image data that includes a central ray position, and send the imagedata to the system control unit. In a configuration, the x-ray systemincludes a computerized tomography (CT) scanner or a rotational x-raysystem and the x-ray system includes a gantry configured to receive thex-ray tube and the TCU.

In another example, a tube control unit (TCU) is configured to calibratea deflected position of a central ray of an x-ray tube to a radiationimager. The TCU includes at least one steering driver, memory, and aprocessor. The at least one steering driver is configured to generate asteering signal for at least one steering coil of a steering magneticmultipole for an x-ray tube. The memory is configured to store steeringposition calibration data representing current values to generate atleast one steering position using the steering magnetic multipole for atube voltage and tube current combination. The processor is configuredto: generate an position correction value representing a distance of adeflected central ray from a specified deflection position of an x-rayimager, generate a deflection value using the steering positioncalibration data, and sum the position correction value and thedeflection value of the central ray for a corrected specified deflectionposition.

In a configuration, the memory is configured to store the steeringposition calibration data that represent current values of the at leastone steering driver. The processor is configured to combine the sum ofthe position correction value and the deflection value with the steeringdriver calibration data.

In another configuration, the TCU includes at least one focus driverconfigured to generate a focusing signal for at least one focusing coilof a focusing magnetic multipole for the x-ray tube. The memory isconfigured to: store focusing position calibration data that representcurrent values of the at least one focus driver, and store tubecalibration data representing current values to generate a specifiedfocal spot size for the x-ray tube. The processor is configured to:generate a size correction value representing an x-ray intensitydifference between the deflected central ray and the central ray at aspecified reference position for the tube voltage and tube currentcombination, and combine the size correction value, tube calibrationdata, and focus driver calibration data.

The summary provided above is illustrative and is not intended to be inany way limiting. In addition to the examples described above, furtheraspects, features, and advantages of the invention will be made apparentby reference to the drawings, the following detailed description, andthe appended claims.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 illustrates a block diagram of an example x-ray tube.

FIG. 2 illustrates a perspective view of a partially exposed examplegantry assembly.

FIG. 3 illustrates a perspective view of an example x-ray tube and acollimator coupled to a rotatable gantry frame.

FIG. 4 illustrates a perspective view of a partially exposed examplegantry assembly showing a geometric center point of an x-ray detectorrelative to a central x-ray beam.

FIG. 5 illustrates an expanded perspective view of an example x-raydetector relative to a central x-ray beam.

FIG. 6 illustrates a perspective view of a partially exposed examplegantry assembly and object showing a geometric center point of an x-raydetector relative to a central x-ray beam.

FIG. 7 illustrates a flowchart for an example mechanical alignment of acentral x-ray beam.

FIG. 8 illustrates a block diagram of an example x-ray system includingan x-ray tube, a tube control unit (TCU), an x-ray detector, and asystem control unit.

FIG. 9 illustrates a cross section side view of a partially exposedexample x-ray tube assembly including focusing magnets and a steeringmagnet.

FIG. 10A illustrates a side view block diagram of an example electronbeam focusing and steering mechanism in an x-ray tube.

FIG. 10B illustrates a front view block diagram of example electron beamfocusing and steering mechanism in an x-ray tube.

FIG. 10C illustrates an expanded front view block diagram of FIG. 17Bshowing the focusing and steering of the electron beam.

FIG. 11 illustrates a side view of an example magnetic yoke with fourpole projections.

FIG. 12 illustrates a side view of an example magnetic yoke with twopole projections.

FIGS. 13A-B illustrate a side view of example quadrupole electromagnetsused for focusing.

FIG. 14 illustrates a side view of an example of two dipoleelectromagnets used for steering.

FIG. 15A illustrates a side view of an example electromagnetic solenoid.

FIG. 15B illustrates an expanded side view of the electromagneticsolenoid core shown in FIG. 15A.

FIG. 16A illustrates a side view block diagram of example electron beamsteering mechanism in an x-ray tube and corresponding central x-raybeam.

FIG. 16B illustrates a front view block diagram of example electron beamsteering mechanism in an x-ray tube and corresponding central x-raybeam.

FIG. 17 illustrates a perspective view of an emitter, focusing magnets,a steering magnet, and an anode.

FIG. 18A illustrates a cross section side view of a partially exposedexample x-ray tube assembly including steering magnets.

FIG. 18B illustrates a perspective view of an example emitter, steeringmagnets, and anode.

FIG. 19 illustrates a perspective view of an example emitter, two dipolesteering coils on a yoke, and anode.

FIG. 20 illustrates a perspective view of an example emitter, a dipolesteering coil on a yoke, and anode.

FIG. 21 illustrates a perspective view of an example emitter, steeringcoils and focusing coils co-wound on a yoke, and anode.

FIG. 22 illustrates an example focal spot deflection pattern showingcentral x-ray beam offset.

FIG. 23 illustrates a flowchart for an example electronic alignment of afocal spot (and a central x-ray beam).

FIG. 24 illustrates a block diagram of an example tube control unit(TCU) and a system control unit.

FIG. 25A illustrates a block diagram of example focus data.

FIG. 25B illustrates a block diagram of example steering data.

FIG. 26 illustrates a range of central x-ray beam offset on an x-raydetector.

FIGS. 27A-B illustrates variations of image dimensions with differencesin x-ray source location.

FIG. 28 illustrates an example of a ring phantom with a center point.

FIGS. 29A-B illustrate examples of line shape phantoms for alignment ortolerance determination.

FIGS. 29C-E illustrate example images of the line shape phantoms shownin FIGS. 29A-B.

FIG. 30 is a flowchart illustrating an example of a method of aligning acentral ray of an x-ray tube to a radiation detector using a tubecontrol unit (TCU).

FIG. 31A illustrates an error in deflection range between central x-raybeam on a flat x-ray detector and a curved x-ray detector.

FIG. 31B illustrates an error in position between central x-ray beam ona flat x-ray detector and a curved x-ray detector.

FIG. 31C illustrates an error in size between central x-ray beam on aflat x-ray detector and a curved x-ray detector.

FIG. 32 illustrates a flowchart for an example adjustment of a focalspot (or a central x-ray beam) for positions in a focal spot deflectionpattern.

FIG. 33 illustrates an example focal spot deflection pattern showingcentral x-ray beam offset and fine adjustment.

FIG. 34 illustrates a range of central x-ray beam fine adjustment on anx-ray detector.

FIG. 35 illustrates distortion between a flat x-ray detector and acurved x-ray detector.

FIG. 36 illustrates a flowchart for an example adjustment of a focalspot size (or a central x-ray beam intensity) for positions in a focalspot deflection pattern.

FIG. 37 is a flowchart illustrating an example of a method of adjustinga central ray of an x-ray tube to a radiation detector for positions ina focal spot deflection pattern using a tube control unit (TCU).

DETAILED DESCRIPTION OF SOME EXAMPLE EMBODIMENTS

Before any embodiments of the invention are explained in detail, it isto be understood that the invention is not limited in its application tothe details of construction and the arrangement of components set forthin the following description or illustrated in the following drawings.The invention is capable of other embodiments and of being practiced orof being carried out in various ways. Numbers provided in flow chartsand processes are provided for clarity in illustrating steps andoperations and do not necessarily indicate a particular order orsequence. Unless otherwise defined, the term “or” can refer to a choiceof alternatives (e.g., a disjunction operator, or an exclusive or) or acombination of the alternatives (e.g., a conjunction operator, and/or, alogical or, or a Boolean OR).

The invention relates generally to electronic calibration of focal spotposition (or central ray position) or electronic calibration of focalspot size (or central ray intensity or x-ray beam energy distribution)and, more particularly, to various methods and components for electroniccalibration of focal spot position and size in a rotating x-ray system,such as a computed tomography (CT) system. Example embodimentsillustrate components and features in an x-ray system, such as an x-raytube, a tube control unit (TCU), system control unit, and radiationimager (e.g., x-ray imager or x-ray detector), for electronicallycalibrating the central ray position and the x-ray beam intensity (i.e.,a focal spot dimension) for different deflected positions of the centralray of the x-ray tube on the radiation imager.

Reference will now be made to the drawings to describe various aspectsof example embodiments of the invention. It is to be understood that thedrawings are diagrammatic and schematic representations of such exampleembodiments, and are not limiting of the present invention, nor are theynecessarily drawn to scale. In some drawings, features are exaggeratedto visually illustrate concepts or principles.

Example X-Ray Tube

FIG. 1 is a block diagram of an example rotary or rotating anode typex-ray tube 100 with a rotatable disc-shaped anode 122. The x-ray tube100 includes a housing 102 and an x-ray insert 110 within the housing102. The housing 102 encloses the insert 110. A coolant or air may fillthe space or cavity between the housing 102 and the insert 110. Acathode 112 and an anode assembly 120 are positioned within an evacuatedenclosure, also referred to as the insert 110. The anode assembly 120includes the anode 122, a bearing assembly 130, and a rotor 128mechanically coupled to the bearing assembly 130. The anode 122 isspaced apart from and oppositely disposed to the cathode 112. The anode122 and cathode 112 are connected in an electrical circuit that allowsfor the application of a high voltage potential between the anode 122and the cathode 112. The cathode 112 includes an electron emitter 116(an emission source) that is connected to an appropriate power source(not shown).

As disclosed in FIG. 1, prior to operation of the example x-ray tube100, the insert 110 is evacuated to create a vacuum. The insert 110encloses the vacuum. Then, during operation of the example x-ray tube100, an electrical current is passed through the electron emitter 116 ofthe cathode 112 to cause electrons “e” to be emitted from the cathode112 by thermionic emission. The application of a high voltagedifferential between the anode 122 and the cathode 112 then causes theelectrons “e” to accelerate from the cathode electron emitter toward afocal spot on a focal track 124 that is positioned on the anode 122. Thefocal track 124 may be composed for example of tungsten (W) and rhenium(Re) or other materials having a high atomic (“high Z”) number. As theelectrons “e” accelerate, they gain a substantial amount of kineticenergy, and upon striking the rotating focal track 124 some of thiskinetic energy is converted into x-rays “x”.

The focal track 124 is oriented so that emitted x-rays “x” are visibleto an x-ray tube window 104. The x-ray tube window 104 includes an x-raytransmissive material, such as beryllium (Be), so the x-rays “x” emittedfrom the focal track 124 pass through the x-ray tube window 104 in orderto strike an intended object (not shown) and then the detector toproduce an x-ray image (not shown). FIG. 1 illustrates a single window104 on the housing 102 (e.g., with a glass insert that allows radiationto pass through the glass, beryllium, or aluminum of the glass insert).In other examples, a separate window may be included on both the insert110 (e.g., a metal insert) and the housing 102, or a window may beincluded on just the insert 110.

X-radiation (composed of x-rays) refers to a form of electromagneticradiation. Most X-rays have a wavelength ranging from 0.01 to 10nanometers (nm), corresponding to frequencies in the range 30 petahertzto 30 exahertz (3×10¹⁶ Hertz [Hz] to 3×10¹⁹ Hz) and energies in therange 100 electron volt (eV) to 100 kilo electron volt (eV).

As the electrons “e” strike the focal track 124, a significant amount ofthe kinetic energy of the electrons “e” is transferred to the focaltrack 124 as heat. To reduce the heat at a specific focal spot on thefocal track 124, a disc-shaped anode target is rotated at high speeds,typically using an induction motor that includes a rotor 128 and astator 106. The induction motor is an alternating current (AC) electricmotor in which the electric current in the rotor 128 needed to producetorque is obtained by electromagnetic induction from a magnetic fieldcreated by current running through the stator winding. Then, the rotor128 rotates a hub of the bearing assembly 130 that is mechanicallycoupled to the anode 122, which rotates the anode 122. In other examples(not shown), the x-ray tube uses a stationary track.

After the x-rays are emitted from the x-ray tube, the x-rays strike ortransmit through an intended object (e.g., the patient or inanimateobject) and then the radiation detector to produce an x-ray image. Theradiation detector includes a matrix or array of pixel detectorelements. The pixel detector elements (e.g., x-ray detector element ordetector element) refers to an element in a matrix or array thatconverts x-ray photons to electrical charges. A detector element mayinclude a photoconductor material which can convert x-ray photonsdirectly to electrical charges (electron-hole pairs) in a directdetection scheme. Suitable photoconductor materials include and are notlimited to mercuric iodide (HgI₂), lead iodide (PbI₂), bismuth iodide(BiI₃), cadmium zinc telluride (CdZnTe), or amorphous selenium (a-Se).In some embodiments, a detector element may comprise a scintillatormaterial which converts x-ray photons to light and a photosensitiveelement coupled to the scintillator material to convert the light toelectrical charges (i.e., indirect detection scheme). Suitablescintillator materials include and are not limited to gadoliniumoxisulfide (Gd₂O₂S:Tb), cadmium tungstate (CdWO₄), bismuth germanate(Bi₄Ge₃O₁₂ or BGO), cesium iodide (CsI), or cesium iodide thallium(CsI:Tl)). Suitable photosensitive element may include a photodiode, aphotogate, or phototransistors. Other circuitry for pixel detectorelements may also be used.

Example Gantry

The x-ray tube and radiation detector can be included in a rotationalx-ray system, such as a computerized tomography (CT) scanner.Computerized tomography (CT) involves the imaging of the internalstructure of an object by collecting several projection images(“radiographic projections”) in a single scan operation (“scan”), and iswidely used in the medical field to view the internal structure ofselected portions of the human body. Typically, several two-dimensionalprojections are made of the object, and a three-dimensionalrepresentation of the object is constructed from the projections usingvarious tomographic reconstruction methods. From the three-dimensionalimage, conventional CT slices (e.g., 16 or 64 slices per gantryrotation) through the object can be generated. The two-dimensionalprojections are typically created by transmitting radiation from a“point source” (e.g., x-ray tube) through the object, which will absorbsome of the radiation based on its size, density, and atomiccomposition, and collecting the non-absorbed radiation onto atwo-dimensional imaging device or imager (i.e., radiation imager orradiation detector), which comprises an array of pixel detectors (simplycalled “pixels”). Such a CT system is shown in FIG. 2.

FIG. 2 illustrates a partially exposed rotating assembly (or gantryassembly) 200, or gantry, of a rotating x-ray system (or rotationalx-ray system). The gantry includes a stationary gantry frame 204 thatsupports a rotatable gantry frame 202. The rotatable gantry can supportan x-ray tube 210, a collimator 230, and a radiation detector or imager240. Alternatively, the collimator can be coupled directly to the x-raytube. The gantry also includes a gantry cover 206 to shield the rotatingcomponents and frame from a user as well as provide an aestheticcovering. The rotatable gantry frame can include an annular shape (i.e.,ring shape) that rotates at a high speed about a center of axis (i.e.,central axis) in a gantry aperture 208 of the rotatable gantry frame.The centrifugal force (or gantry force) on components disposed on therotatable gantry frame can experience a high force, which can exceed agravitational force (g-force, G's, or G loads) or a multiple of theg-force (e.g., 20 times the g-force). In other examples not shown, therotatable gantry frame may rotate less than a full revolution, such asrotation of 180° or greater in a C-arm scanner.

X-Ray Tube Mechanical Alignment

Conventionally, as previously described, the x-ray tube is mechanicallyaligned to the gantry and the collimator so the central ray of the x-raytube is centered on a specified location on the detector (e.g., centerpoint on the detector) based on movement of the x-ray tube. Alignment ofthe x-ray tube is used to ensure image quality, good accuracy, and highresolution. Mechanical alignment or adjustments—repositioning of thex-ray tube—to achieve alignment, especially for higher precision of thecentral ray can be time consuming, cumbersome, iterative, and thequality of the alignment can be highly dependent on the skill of thetechnician performing the mechanical alignment. In some mechanicalalignment processes, the central ray is aligned by moving the x-ray tubeand collimator.

FIG. 3 illustrates an expanded view of the x-ray tube 210 and thecollimator 230 mounted to the rotatable gantry frame 202 via an x-raytube mounting bracket 228. For descriptive purposes, FIG. 3 provides aCartesian coordinate system with the y-axis in the radial direction fromcenter of axis of the gantry (e.g., the vertical direction in FIG. 3),the x-axis is in the circumferential direction around the center of axisof the gantry (e.g., the horizontal direction in FIG. 3) and orthogonalto the y-axis, and the z-axis is orthogonal to the x-y plane in theaxial direction. The rotation of the gantry occurs in the x-y plane. Thex-ray tube mounting bracket provides two dimensional (2D) adjustment ofthe x-ray tube in the x-z plane. An x-axis adjustment nut, bolt, turret,or knob 212 provides adjustment of the x-ray tube in the x-axis based onan x-axis adjustment nut rotation 216. An x-axis indicator or dial 222can indicate a change in position in the x-direction of the x-rayrelative to the rotatable gantry frame 202 or collimator 230 withmicrometer type measurements. Similarly, a z-axis adjustment nut, bolt,turret, or knob 214 provides adjustment of the x-ray tube in the z-axisbased on a z-axis adjustment nut rotation 218. A z-axis indicator ordial 224 can indicate a change in position in the z-direction of thex-ray relative to the rotatable gantry frame 202 or collimator 230 withmicrometer type accuracy.

With an aligned x-ray tube 210 to the rotatable gantry frame 202, apoint source (e.g., x-ray tube) and a center of the two-dimensionalimager (e.g., x-ray detector 240) lie on a common axis (i.e., a y-axis),which may be called the projection axis. The source's radiation (e.g.,x-rays) emanates toward the imaging device in a volume of space definedby a right-circular, elliptical, or rectangular cone (based on thecollimator used) having its vertex at the point source and its base atthe imaging device with a central ray emanating from the vertexrepresenting the center point of the x-radiation.

FIGS. 4 and 5 illustrate a gantry assembly showing an x-ray detectorgeometric center point 242 relative to a central x-ray beam 352. FIG. 6illustrates an object feature 252 (or phantom) of an object used todetermine the central ray location on the x-ray detector. Initially whenthe x-ray tube 210 is installed on the rotatable gantry frame 202, thecentral ray is usually misaligned with the x-ray detector geometriccenter point (or other specified imager location), as shown. Analignment process moves the central ray to the x-ray detector geometriccenter point within a specified tolerance.

Conventionally, the alignment process is entirely mechanical, whichmechanical alignment moves the x-ray tube 210 relative to the rotatablegantry frame 202, so the central ray 352 is located at the x-raydetector geometric center point 242 within the specified tolerance.While coarse mechanical alignment (e.g., within ±0.5 to 0.1 millimeter[mm]) can be achieved with proper fixturing of the x-ray tube mountingbracket 228 or the x-ray tube 210, fine mechanical alignment can bebased on an iterative process by which images or data are acquired andthe tube or collimator orientation is adjusted mechanically usingadjustment tools (e.g., wrenches or adjustment nuts, bolts, turrets, orknobs 212 and 214) and measuring devices (e.g., indicators or dials 222and 224 or micrometers).

For high resolution images, fine adjustments in the sub millimeter rangedown to micrometers can be needed. In order to achieve the correctpositioning of the central ray 352 (representing the x-ray tubeposition), a series of images are taken and the central ray isdetermined. Subsequently, the x-ray tube is adjusted and another seriesof images is taken to determine the position. The central ray or x-raytube is adjusted and the sequence is repeated until a satisfactoryalignment is achieved.

FIG. 7 illustrates an example flowchart of the mechanical alignment 600of the x-ray tube, which aligns the central x-ray beam to a specifiedimager location. The user (e.g., operator or technician) removes thegantry covers 602, which exposes the rotatable gantry frame. The imageror detector is exposed to x-rays from the x-ray tube 604, usually withan alignment object or phantom. The image of the x-ray detector isprocessed 606 by a processor in the x-ray detector or a system controlunit to generate a central x-ray beam position on the detector fromwhich an offset representing a distance of the central ray from thespecified imager location (e.g., the x-ray detector geometric centerpoint) is determined 608. The offset can represent a 2D distance in thex-z plane (i.e., with an x-axis component and a z-axis component). Theuser (or automated process or robot) determines if the offset is withinan acceptable tolerance or precision (e.g., <50-200 microns [μm ormicrometers]) 610. If the offset is not within an acceptable toleranceor precision, the x-ray tube is adjusted by the offset in thex-direction, z-direction, or both using adjustment tools (e.g., nuts,bolts, turrets, knobs, or wrenches) and measuring devices (e.g.,indicators, dials, or micrometers) 612. The detector is again exposed tox-rays 604, and the process repeats until the offset is within theacceptable tolerance or precision. Once the offset is within anacceptable tolerance or precision, the user locks down the x-ray tubeposition 614 with fasteners (not shown; e.g., screws, nuts, bolts,turrets, or knobs) and replaces the gantry covers 616. Due to the highprecision of the fine mechanical alignment, the iterative adjustment ofthe x-ray tube or collimator can take over ½ to 1 hour to complete. Thetime to perform a fine mechanical alignment can increase as theacceptable tolerance or precision becomes smaller.

X-Ray Tube Electronic Alignment

Using electronic alignment for the fine alignment can remove theiterative steps in the manual adjustment process, which can save time incalibrating the x-ray tube to the gantry assembly. The coarse mechanicalalignment can be performed with relative ease and in a relatively shortduration of time, as previously discussed, and the subsequent iterativeprocess of the fine alignment can be performed by an electronicalignment process (i.e., adjustment of the current going to the magneticcoils and resulting magnetic forces on the electron beam in the x-raytube), thereby saving time and money.

FIG. 8 illustrates an x-ray system 400 that can be used for electronicalignment, which includes an x-ray tube 410, a tube control unit (TCU)440, an x-ray detector 420 or imager, and a system control unit 430. TheTCU can be a separate component from the x-ray tube. In another example(not shown), the TCU is integrated with the x-ray tube. A high voltagetube generator (not shown) can provide a tube voltage (e.g., kilovolts[kV]), tube current (e.g., milliamps [mA]), and exposure duration (e.g.,seconds [s]). As a result, the x-ray tube 410 emits an electron beamwhich collides with an anode target to generate an x-ray beam 412 with acentral ray. The x-ray detector 420 detects the x-rays and generatesimage data 422 which contains the central ray position information,which is sent to the system control unit 430. The system control unit430 generates position information 432, which can include an offset ofthe central ray relative to a specified imager location (e.g., the x-raydetector geometric center point), which can be sent to the TCU 440. TheTCU 440 can provide control signals 416, such as signals to controlsteering magnetics and focusing magnetics in the x-ray tube. In someexamples, the x-ray tube can provide tube data, such as feedback, to theTCU. In another example (not shown), the TCU can be coupled to the tubegenerator and also provide tube voltage, tube current, and exposureduration control.

A magnetic steering mechanism of the x-ray tube and TCU electronics canbe used to produce a constant offset superimposed on a focal spotdeflection pattern, as described in greater detail with FIG. 22. Thedeflection pattern (or steering pattern) is a series of locations thefocal spot is steered to in order to improve image resolution or animage signal to noise ratio. By applying an additional constant currentoffset to steering coils of the magnetic steering mechanism, theelectron beam can be statically directed to a location within in a 2Dplane of the x-ray detector, which allows an electronic alignment of thex-ray beam of the x-tube with the collimator or x-ray detector of thex-ray system.

In an example, a group of magnet pairs is oriented in the X and Ydirection, substantially perpendicular to the electron beam in the x-raytube. Current through the steering coils creates two magnetic fieldswhich can be perpendicular to each other. The strength of the magneticfield can be controlled by the number of windings on the steering coilsand the current driven through the steering coils. Deflection of themagnetic beam within a region of interest of the magnetic field can beconsidered linear and the amount of deflection is related to themagnetic field strength. Since magnetic fields along the x-axis andy-axis superimpose on each other, the electron beam can be directed to alocation within the 2D x-y plane by applying respective current to thecoils. The specific applied current creates the magnetic field needed toachieve a desired deflection. While a perpendicular arrangement of thesteering coils can simplify current calculations to the steering coil, anon-perpendicular arrangement of the steering coils may also be used, asmagnetic fields are vectors that can be superimposed. In one example,the steering coils can be oriented at various angles within thedeflection plane or be broken up into multiple sequential coils along athird axis (e.g., z-axis) achieving deflection in multiple steps alongthe path of the electron beam. Additionally, more pairs of magnets canbe added to form an array of steering magnets, so a vector sum of themagnetic fields produces the desired steering field for offsets andlocations.

Focusing magnetics can also be used to focus or refocus the electronbeam along the beam path from the emitter to the anode, as the electronbeam tends to diverge with an increased distance between the emitter andthe anode. By adding the deflection mechanism (or steering magnetics) tothe x-ray tube, the distance between the emitter and the anodeincreases, resulting in an expanding focal spot size. The electron beamdivergence can be observed as defocusing of the focal spot (e.g.,reducing image resolution), hence an electronic focusing or refocusingmechanism can be used to counter act the expanding or diverging electronbeam by focusing the beam in a small area on the anode.

FIG. 9 illustrates an example x-ray tube assembly 302 that includes bothsteering magnetics 330 and focusing magnetics 340 and 342 that can beused for electronic alignment, more specifically electronic central rayalignment or electronic focal spot alignment. Electronic central rayalignment, which involves moving a focal spot 324 (FIG. 10C) on a focaltrack 323 of an anode 322, can also be referred to as electronic focalspot alignment. Electronic focal spot alignment uses the steering coils330 and TCU electronics 440 (FIG. 8) of the x-ray tube magnetics toalign the focal spot with the imaging system (i.e., x-ray imager ordetector).

The x-ray tube assembly 302 includes cathode assembly 310, a driftregion 314, and an anode assembly 320. The cathode assembly 310 includesan emitter assembly 312 that generates an electron beam with acenterline 316 that passes through the drift region. The drift region314 is surrounded by focusing magnetics 340 and 342 and steeringmagnetics 330, which may be outside the vacuum envelop formed by theinsert wall 309 (in the throat of the x-ray tube). An x-ray tube can beconsidered to have a long throw length when a drift region includesfocusing magnetics and steering magnetics. The electron beam passesthrough an aperture 329 of a shield component, electron shield, orelectron collector and strikes an anode target or anode 322 to generatex-radiation 350 with a central x-ray beam 352. The instantaneous areaimpacted by the electron beam on the anode is referred to as a focalspot and the area struck by the electron beam on rotary anode isreferred to as the focal track 323. The x-rays may exit the x-ray tubethrough a window 308.

As shown, the focusing magnetics includes a first focusing magneticquadrupole 340 (or cathode focusing magnetic quadrupole) and a secondfocusing magnetic quadrupole 342 (or anode focusing magneticquadrupole), and the steering magnetics includes two steering magneticdipoles on a core 330, as illustrated in FIGS. 10A-B. FIGS. 10A-Cillustrate various views of electron beam focusing and steering in anx-ray tube 300. Electrons are emitted from the electron source 390 andaccelerated towards the anode target 322. The electron beam includesnegatively charged particles that have a repelling force between theelectrons in the beam, which causes the electron beam to diverge or thecross sectional area (i.e., in the x-y plane) of the electron beam toexpand (i.e., defocus) as the electrons travel from the electron source390 (e.g., an emitter of the cathode assembly) to the anode 322. Thus,the electron density of the beam spreads the beam apart during transit,which may be significant. As a result the focal spot area can be largerthan the cross sectional area of the electron beam at the electronsource. This expansion or spreading of the electron beam can be referredto as electron beam bloom, electron bloom, or focal spot bloom, whichcan be greater with slower speeds of the electrons (i.e., lower tubevoltages), greater electron densities (i.e., higher tube currents), orgreater distances between the electron source and the anode target.Large focal spots distribute the x-ray energy over a larger physicalarea relative to small focal spots which can reduce the resolution ofthe x-ray images. The additional space used to add steering magnetics inthe drift region can increase propensity for focal spot blooming (i.e.,focal spot size growth due to beam space charge effects).

FIGS. 10A-C illustrate an electron beam 318 with electron bloom (i.e.,defocusing), focusing, and steering. The electron beam has a centerline317 that is steered up (as shown in FIGS. 10A-C) and to the left (asshown in FIGS. 10B-C). Electron bloom projections without focusing 319are also illustrated, which can result in an enlarged focal spot orblurred focal spot (i.e., electron beam cross section with electronblooming or focal spot blooming 325). As shown, the centerline of theelectron beam 317 may not change substantially with focusing ordefocusing. On the way to the anode the electron beam is focused on asmall area on the anode by the focusing mechanism. The focusingmagnetics reduces focal spot blooming by compressing the electron beamin at least one direction. For example, the first focusing magneticquadrupole 340 is configured for providing a first focusing magneticquadrupole gradient for focusing the electron beam in a first direction(e.g., y-axis) and defocusing the electron beam in a second direction(e.g., x-axis) orthogonal to the first direction (i.e., electron beamcross section after first focusing 326, illustrated as a flat ellipse).The second focusing magnetic quadrupole 342 is configured for providinga second focusing magnetic quadrupole gradient for focusing the electronbeam in the second direction (e.g., x-axis) and defocusing the electronbeam in the first direction (e.g., y-axis) (i.e., electron beam crosssection after second focusing 327). The combination of the first andsecond focusing magnetic quadrupoles provides a net focusing effect inboth first and second directions of a focal spot 324 of the electronbeam 318. The net focusing effect produces a high intensity x-ray beam359 with a central x-ray beam 358 that impinges on the x-ray imager 306.The x-ray beam is shown as a narrow beam to illustrate a high intensityfor a narrow focal spot. An actual x-ray beam may have a cone shape withlower intensity x-ray further away from the central x-ray beam 358.

The steering magnetics includes two steering magnetic dipoles on a core330. The two steering magnetic dipoles 330 are configured to deflect theelectron beam in order to shift a focal spot of the electron beam on atarget surface or focal track of the anode (in the x-y plane), which inturn moves the generated x-ray beam 359 with a central x-ray beam 358(in the x-z plane). One steering magnetic dipole moves the focal spot inthe x-axis (resulting in the central ray moving along the x-axis) andthe other steering magnetic dipole moves the focal spot in the y-axis(resulting in the central ray moving along the z-axis).

U.S. patent application Ser. No. 14/660,584 (or U.S. Patent ApplicationPublication No. 2015/0187536) entitled, “X-Ray Tube Having PlanarEmitter and Magnetic Focusing and Steering Components,” which isincorporated by reference in its entirety, discloses examples ofmagnetic focusing components and magnetic steering components.

FIG. 11 illustrates a magnet system 360 with a magnetic yoke 362 havingfour pole projections 364, where each pole projection includescorresponding coils 366. The coils 366 can be formed of wire, windings,or turns around the pole projections core that include an electricalconductive material (e.g., copper or aluminum) with an electricallyinsulated sheath, such as enameled magnet wire (i.e., transformer wire).A current through the coils produces a magnetic field emitted from thepole projections.

The core (or yoke) 362 shown has a substantially circular or annularshape, it will be appreciated that each of the core (or yoke) portionscan also be configured with different shapes, such as a rectangular,ellipsoid (i.e., oval), or semi-circular shape, as long as the core atleast partially surrounds the electron beam (e.g., in the drift region).The pole projections 364 can include projections that extend from theinterior of the core and oppose or face each other in pairs (e.g., poleprojections of coils 366A and 366C oppose or face each other and poleprojections of coils 366B and 366D oppose or face each other).

The yoke 362 and pole projections 364 can include ferromagnetic orferrimagnetic materials. Ferromagnetic and ferrimagnetic materials arematerials that can exhibit spontaneous magnetization. More specifically,a material is “ferromagnetic” if all of its magnetic ions add a positivecontribution to the net magnetization. If some of the magnetic ionssubtract from the net magnetization (if magnetic ions are partiallyanti-aligned), then the material is “ferrimagnetic”. A ferrimagneticmaterial is one that has populations of atoms with opposing magneticmoments, as in antiferromagnetism. However, in ferrimagnetic materials,the opposing moments are unequal and a spontaneous magnetizationremains. Ferromagnetism occurs in a few substances, such as iron (Fe),nickel (Ni), cobalt (Co), their alloys, and some alloys of rare earthmetals. For example, ferromagnetic compounds or materials includemanganese bismuth (MnBi), manganese antimony (MnSb), chromium dioxide orchromium (IV) oxide (CrO₂), manganese arsenic (MnAs), gadolinium (Gd),dysprosium (Dy), and europium oxide (EuO). Ferrimagnetic compounds ormaterials include iron (III) oxide (Fe₂O₃) or ferric oxide, iron(II,III) oxide (FeOFe₂O₃ or Fe₃O₄), nickel oxide-iron (III) oxide(NiOFe₂O₃), copper oxide-iron (III) oxide (CuOFe₂O₃), magnesiumoxide-iron (III) oxide (MgOFe₂O₃), manganese oxide-iron (III) oxide(MnOFe₂O₃), and yttrium iron garnet (Y₃Fe₅O₁₂). As used herein and forsimplicity in the description, a “ferromagnetic” material refers to amaterial that can exhibit spontaneous magnetization (i.e., either aferromagnetic material or a ferrimagnetic material).

For example, the yoke 362 and pole projections 364 includes can includevarious materials, such as solid metal core (e.g., a silicon steelcore), a powdered metal core (e.g., carbonyl iron core), and ferrite orceramic cores. The solid metal cores can include “soft” (annealed) iron,“hard” iron, laminated silicon steel, special alloys (specialized alloysfor magnetic core applications, such as mu-metal, permalloy, andsupermalloy), and vitreous metals (e.g., amorphous metal alloys [e.g.Metglas] that are non-crystalline or glassy).

The four poles 364 of the magnet system 360 shown in FIG. 11 can beconfigured as a quadrupole (e.g., used for focusing) or configured as apair of dipoles (e.g., used for steering). In a quadrupoleconfiguration, the coils of the four poles are electrically coupledtogether in series, which can be coupled to a power supply. In a dipoleconfiguration, the coils of two opposing poles are electrically coupledtogether in series, which can be coupled to a power supply. If twodipoles are located on the same yoke, each dipole can be coupled toseparate power supplies.

FIG. 12 illustrates a magnet system 370 with a magnetic yoke 372 havingtwo pole projections 364, where each pole projection includescorresponding coils 366. The two poles of the magnet system 370 shown inFIG. 12 can be configured as a dipole (e.g., used for steering).

FIG. 13A shows a first focusing magnet 340 having a yoke 362 configuredas a quadrupole (e.g., cathode-side focusing magnetic quadrupole 340),and FIG. 13B shows a second focusing magnet 342 having a yoke 362, alsoconfigured as a quadrupole (e.g., anode-side focusing magneticquadrupole 342). Each quadrupole creates a magnetic field having agradient, where the magnetic field intensity differs within the magneticfield. The gradient is such that the magnetic quadrupole field focusesthe electron beam in a first direction (e.g., y-axis) and defocuses in asecond direction (e.g., x-axis) that is perpendicular to the firstdirection. The two quadrupoles can be arranged such that theirrespective magnetic field gradients are rotated about 90° degrees withrespect to each other. A first magnetic field 346 generated by the firstfocusing magnetic quadrupole 340 is shown in FIG. 13A, and a secondmagnetic field 348 generated by the second focusing magnetic quadrupole342 is shown in FIG. 13B. The first focusing magnetic quadrupole 340focuses in a length direction (e.g., y-axis), and defocuses in widthdirection (e.g., x-axis) of the electron beam. The electron beam is thenfocused in a width direction (e.g., x-axis) and defocused in lengthdirection (e.g., y-axis) by the following the second focusing magneticquadrupole 342. In combination the two sequentially arranged magneticquadrupoles insure a net focusing effect in both directions of the focalspot.

FIG. 14 illustrates a steering magnet 330 having a yoke 362 configuredwith two sets of dipole coils. The first set of dipole coils (y-axisdipole coils) 366A and 366C generate a uniform or laminar magnetic field338 in one direction (e.g., y-axis), and the second set of dipole coils(x-axis dipole coils) 366B and 366D generate a uniform or laminarmagnetic field 336 in another direction (e.g., x-axis). The steeringmagnet allows for 2D steering of the electron beam (e.g., in the x-yplane) and resulting in a change in position of the focal spot (e.g., inthe x-y plane) and the central ray (e.g., in the x-z plane). The uniformor laminar magnetic fields between the poles projections provides ahomogeneous magnetic field in the area where the electron beam crossesthe steering magnetic field (e.g., in the x-y plane), so electrons inthe electron beam experience a similar amount of deflection, which canmaintain a focal spot shape without substantial geometric distortion.Using orthogonal magnetic fields (i.e., a set dipole pole projectionsthat are perpendicular to another set of dipole pole projections) cansimplify magnetic vector calculation, but non-orthogonal magnetic fieldsmay also be used.

FIGS. 15A-B illustrate a solenoid electromagnet 150 (e.g., withcylindrical core 151) with windings or a coil 152 (e.g., single coil).Although a magnetic core 151 is shown for ease of illustration, thesolenoid electromagnet may not require the magnetic core and similarmagnetic fields still exit within the coil 152 of the solenoidelectromagnet 150 (with an open center volume). The same principlesregarding the solenoid electromagnet apply with or without a magneticcore. The magnetic flux 160 within the solenoid magnet core 151 (orwithin the coil 52) are substantially uniform from the south pole 156 tothe north pole 154, but the magnetic flux 162 external to (e.g.,surrounding) the solenoid magnet 150 are dissimilar and varied from thenorth pole 154 to the south pole 156. If a solenoid electromagnet isused for electron beam steering, the magnetic field 162 experienced bythe electron beam 168 is very inhomogeneous. The amount of inhomogeneityincreases with the distance between the electron beam and the solenoid,so the electrons at the bottom of the electron beam (closer to thesolenoid) experience a different amount of deflection than electrons atthe top of the beam (further from the solenoid). This difference indeflection causes the focal spot to change shape and size, and in anextreme case can cause the top and bottom of the electron beam to crosseach other. Not only is the magnetic field inhomogeneous, the magneticfield at different points in the electron beam also has different vectordirections (e.g., not all vertical or horizontal), so the direction ofthe force on the electrons in the electron beam change not only based onposition in the electron beam (in the x-y plane) but the direction ofthe force on the electrons also changes during the crossing of themagnetic field (in the z-axis). In addition, the magnetic field (fromthe solenoid) has less force with a greater distance from the poles(e.g., electron beam separated from the pole ends of the solenoid, whichmay also include an insert wall between the solenoid and the electronbeam). For example, a magnetic force at a distance of a radius r 158away from the pole end of the solenoid (e.g., north pole 154) can be afactor of ten times less than the magnetic force at the pole end of thesolenoid. Given the inconsistent deflection throughout the electron beamin both magnitude and direction due to the varying magnetic fields andvectors generated by the solenoid electromagnet, the solenoid typeelectromagnetic is problematic for fine control of the deflection of theelectron beam used in steering. Focal spots created using the solenoidelectromagnet for steering can suffer from severe distortion in shapeand size. Changes in the shape or size (i.e., enlarged size) of thefocal spot can negatively impact image quality and resolution, so anx-ray system generating such focal spots can be limited in detectingfine structures. Furthermore, without focusing, the challenges ofinhomogeneous magnetic field from the solenoid electromagnet inconjunction with the repelling force between electrons causing bloomingof the focal spot can generate a focal spot that is so large that theresulting image does not have a usable resolution.

Referring back to FIG. 14, the magnetic core that surrounds the electronbeam with pole projections on opposite sides of the electron beam cangenerate a homogeneous magnetic field so the electrons in the electronbeam experience a similar magnetic field and deflection enabling a finecontrol of the position of the focal spot. Fine control of the size ofthe focal spot can be provided by the focusing magnetics, previouslydescribed. As previously discussed, the magnetic field between thedipoles can be linear and perpendicular to travel direction of theelectron beam so the electrons experience a similar amount of deflectionin a substantially same direction.

Although, a four pole magnet system is shown for the focusing magnetics340 and 342 and steering magnetics 330 in FIGS. 9-10C, 13A-14, and16-17, other configurations of a magnetic multipole may be used with atleast two poles. In a four pole magnet system, the coils can beconfigured as a quadrupole or a pair of dipoles. In a two pole magnetsystem, the coils can be configured as a dipole. It can be appreciatedthe magnet system used for focusing or steering can have multiple poles(e.g., two, four, six, or eight) and can have various configurations(e.g., dipole, quadrupole, hexapole, or octupole).

FIGS. 16A-B illustrate an electron beam steering mechanism 330integrated in an x-ray tube 300 controlled by the TCU that can providefine electronic central ray alignment or fine electronic focal spotalignment for the x-ray tube. As electrons impact the anode 322, x-raysare emitted. The location of the electron impact is projected onto thex-ray detector 306, thus a change in the location of the impact changesthe location of the central x-ray beam on the x-ray detector 306. Henceby static deflection of the electron beam, the central x-ray beamlocation on the detector can be changed. The steering mechanism 330 isused to align the central x-ray beam location with an image axis.Misalignment of the x-ray axis (or central x-ray beam) with the imagingaxis results in blurring and geometric distortion of the image and canthereby degrade image quality and diagnostic value of the image.

For example, based on the signals (e.g., current) applied to the coilsof the steering magnet 330 the electron beam centerline 316 can beadjusted to different positions due to changes in focal spots on theanode 322, resulting in different central ray 352, 354, 355, 356, and357 positions. Central ray 354, 355, 356, or 357 positions result from adeflected electron beam. By moving the location of the electron impacton the target of the anode 322, the location of the central ray on thex-ray detector 306 is changed. An upward (e.g., y-axis) steered electronbeam results in an downward (e.g., z-axis) steered central x-ray beam354, and an downward (e.g., y-axis) steered electron beam results in anupward (e.g., z-axis) steered central x-ray beam 355. A left (e.g.,x-axis) steered electron beam results in a left (e.g., x-axis) steeredcentral x-ray beam 356, and a right (e.g., x-axis) steered electron beamresults in a right (e.g., x-axis) steered central x-ray beam 357.Without an applied signal to the coils of the steering magnet 330 thecentral x-ray beam 352 is referred to as a non-steered central x-raybeam or a central x-ray beam without an offset.

FIG. 17 illustrates a perspective view of x-ray tube components showingthe emitter assembly 382, focusing magnets 340 and 342, a steeringmagnet 330, and anode 322, which configuration is similar to the x-raytube assembly shown in FIG. 9. The components in FIG. 17 can provideelectronic central ray alignment or fine electronic focal spot alignmentfor the x-ray tube. The emitter assembly 382 is shown with a planaremitter 392. U.S. patent application Ser. No. 14/660,607 (or U.S. PatentApplication Publication No. 2015/0187530) entitled, “X-Ray Tube HavingPlanar Emitter with Tunable Emission Characteristics,” which isincorporated by reference in its entirety, discloses an example planaremitter.

FIGS. 18A-B illustrates an x-ray tube assembly that includes twosteering magnet cores 330 and 332. In an example, a first steeringmagnet 330 can provide a first steering magnetic field and a secondsteering magnet 332 can provide a second steering magnetic force (e.g.,ultra-fine adjustment or steering). FIG. 18B illustrates an emitterassembly 384 with a coil emitter 394. A planar emitter or coil emittercan be used with the various focusing and steering magnetics shown ordescribed.

FIG. 19 illustrates a perspective view of x-ray tube components showingthe emitter assembly 384, a steering core with two dipole steering coils330, and anode 322. The steering core 330 can provide 2D steering.

FIG. 20 illustrates a perspective view of x-ray tube components showingthe emitter assembly 384, a steering core with dipole steering coils334, and anode 322. The steering core 334 can provide one dimensional(1D) steering (e.g., along the y-axis).

FIG. 21 illustrates a perspective view of x-ray tube components showingthe emitter assembly 382, anode 322, a focusing magnet 340, and a secondfocusing magnet 344 that includes core with pole projections, where eachpole projection includes focusing coils and steering coils. The secondcore assembly 344 is configured to provide both focusing and steering.The magnet field vectors from focusing and steering can be super imposedon each other. In an example, the focusing coils and steering coils canuse different power supplies or driver circuits.

The steering magnetics can be used to change the location of the centralray relative to the x-ray imager 306. The central ray may change ortoggle during a scan (e.g., CT scan) or an x-ray exposure based on thelocation and orientation of an object relative to the x-ray imager 306at a specified time. An x-ray system may use a central ray beamdeflection pattern 500 (or a focal spot deflection pattern), asillustrated in FIG. 22. The number of deflection points and position ofdeflection points depend on a particular deflection pattern (or steeringpattern). An order in which the different deflection points are steeredcan depend on the imaging requirements. A deflection pattern can be usedfor a particular x-ray system or type of image being acquired (e.g.,specific patient anatomy). Each deflection position can be orientedrelative to a specified imager location (e.g., the x-ray imagergeometric center point 8) within a steering range 503. The steeringrange 503 may be greater than, equal to, less than, or a different shapefrom the exposure area of the x-ray imager 306. The deflection pattern500 shown in FIG. 22 includes eight deflection points 1-8 with anon-deflected center point 8. In an image acquisition, the x-ray systemmay only toggle between a few points or toggle through any combinationof the deflection points (e.g., eight points). The sequences andlocation can depend on an imaging goal. For example, if a goal is toincrease resolution in the horizontal direction, the x-ray system maytoggle between points 8 and 7, 8 and 6, or 5 and 8. An order andlocation for the steering pattern can be determined by a systemmanufacturer or an imaging physicist.

In electronic central ray alignment (or electronic focal spotalignment), a constant offset value can be added to a central rayposition or a steered ray beam position. FIG. 23 illustrates an exampleflowchart of the electronic central ray alignment 620 of the x-ray tube,which aligns the central x-ray beam with the specified imager location.First, a relatively coarse mechanical alignment can be performed 600. Inone example, the coarse mechanical alignment is less than (<) 0.5 mm. Inanother example, the coarse mechanical alignment is <0.1 mm. The time toperform the course mechanical alignment can be less than 30 minutes(e.g., 15 minutes). The remaining offset (to an acceptable tolerance)can be adjusted by the steering magnetics (e.g., steering the electronbeam) in the x-ray tube. The electronic central ray alignment allows afar finer and accurate adjustment than mechanical alignment, which alsocan be adjusted in shorter timeframe. The electronic fine adjustmentprocess can be performed by changing a digital offset value compared tofine mechanical adjustments accomplished with measurements and tools.

Referring back to the flowchart 620, the imager or detector is exposedto x-rays from the x-ray tube 624, usually with an alignment object orphantom. The image of the x-ray detector is processed 626 by a processorin the x-ray detector or a system control unit, and the processorcalculates an offset (or offset value) representing a distance of thecentral ray on the imager from the specified imager location (e.g., thex-ray detector geometric center point) 628. In one example, the offsetrepresents a 2D distance of the focal spot in the x-y plane (i.e., withan x-axis component and a y-axis component) or the central ray in thex-z plane (i.e., with an x-axis component and a z-axis component). Inanother example, the offset represents a 1D distance of the focal spotalong the x-axis or the y-axis or the central ray along the x-axis orthe z-axis. The processor determines if the offset is within anacceptable tolerance or precision 630 (e.g., the central ray with theoffset is within an acceptable tolerance or precision). In an example,the offset value can have an acceptable tolerance or precision that is<25 μm (from perfect alignment). In another example, the offset valuecan have an acceptable tolerance or precision that is <200 μm (fromperfect alignment). The precision of the alignment can depend on thefocal spot size, an imager pixel size, temporal resolution desired, andthe image quality requirements for an x-ray system. For example, in CTimaging, shifting the central x-ray beam by ¼ detector pixel size canavoid aliasing and increase the temporal resolution. Pixel aliasing canoccur when a pixel detects light or x-rays intended for a neighboringpixel, which can cause image artifacts. In such a case, the fineelectronic alignment can set the precision to ¼ pixel and an align downto ¼ pixel. If the detector pixel size is 100 μm, the processorcalculates an offset to align and shift the pixel of the imager to oneside by 25 μm. Hence, the precision of the fine alignment can be atleast 25 μm. At least one mechanism for determining the alignment for aspecified precision is provided below.

Referring back to the flowchart 620, if the offset is not within anacceptable tolerance or precision, the offset is added to an existingoffset (if any) 632. The steering magnetics adjust the focal spot by theoffset and the detector is exposed with the central ray that includesthe applied offset 634, and the process repeats until the offset iswithin an acceptable tolerance or precision. In an example, the offsetcan be applied to the steering magnetics using a steering signalgenerated from the TCU. Once the offset is within an acceptabletolerance or precision, the offset can be saved 636. The offset can besaved in the TCU associated with the x-ray tube. In an example, adifferent offset can be calculated with each tube voltage and tubecurrent combination. The offset can also be calculated based on othercharacteristics of the x-ray tube, focal spot, or steering mechanism,such as temperature or focal spot size. With increase temperature, thefocal spot and the resulting central ray can shift, known as thermaldrift. Temperature can be measured via a temperature sensor orcalculated based on other parameters (e.g., tube voltage, tube current,running exposure time and non-operating time) In another example, theelectronic alignment can be extended to adjust for thermal drift as wellas mechanical misalignment. The offset can be calculated with a specifictube voltage, a specific tube current, a specific tube temperature, orother focal spot or steering varying characteristic or parameter incombination.

The electronic alignment or adjustment can provide an automatedalignment as measurement values can be directly fed back to anadjustment system (e.g., digital adjustment system) when the x-ray tubeor TCU are coupled with the system's imager or detector. The electronicalignment can adjust the focal spot in 2D space utilizing an x-raytube's existing beam steering or deflection mechanism.

In the electronic alignment portion of the alignment process, the gantrycovers do not need to be removed or further mechanical adjustment maynot be needed once initially provided. The fine tune alignment moves theelectron beam using the steering magnetics within the x-ray, the imageis evaluated, and the electron beam is adjusted in either adeterministic or iterative adjustment cycle.

FIG. 24 illustrates a tube control unit (TCU) 440 with position control,status, or error signals 432 communicated with the system control unit430. The TCU can be configured for a specific x-ray tube. The TCUincludes a focus power supply 446, a focus driver 460, a steering powersupply 442, a steering driver 450, and a control module 470. The focuspower supply 446 provides power 448 to the focus driver 460 and canprovide power 447 to other components (e.g., control module 470). Thesteering power supply 442 provides power 444 to the steering driver 450and can provide power 443 to other components (e.g., control module470).

The focus driver provides the focusing signal (e.g., current) for thecoils of the focusing magnetics (340 or 342 of FIGS. 9 and 17; 344 ofFIG. 21). The focus driver can include at least one focus driver. In theTCU shown in FIG. 24, the focus driver 460 can include a first focusdriver 462 and a second focus driver 466. The first focus driver 462 canprovide the focusing signal (e.g., current) to coils of the firstfocusing magnet (340 of FIGS. 9, 17, and 21), and the second focusdriver 466 can provide the focusing signal (e.g., current) to coils ofthe second focusing magnet (342 of FIGS. 9 and 17; 344 of FIG. 21). Eachfocus driver 462 or 466 can receive a strength value 464 or 468 from thecontrol module 470 and provide an error signal 463 or 467 (or handshaking signal) to the control module 470.

The steering driver can include at least one steering driver. In the TCUshown in FIG. 24, the steering driver 460 can include an x-positiondriver 452 and a y-position driver 456. The x-position driver 452 canprovide the steering signal (e.g., current) to the x-axis dipole coils(366B and 366D of FIG. 14) of the steering magnet (330 of FIGS. 9, 17,18A-B, 19; 334 or FIG. 20; 344 of FIG. 21 [if rotated 45°]), and they-position driver 456 can provide the steering signal (e.g., current) tothe y-axis dipole coils (366A and 366C of FIG. 14) of the steeringmagnet (330 of FIGS. 9, 17, 18A-B, 19; 344 of FIG. 21[if rotated 45°]).Each steering driver 452 or 456 can receive a position value 454 or 458from the control module 470 and provide an error signal 453 or 457 (orhand shaking signal) to the control module 470.

The control module 470 includes a processor 472 and data storage 480.The processor can include memory 473 and a central processing unit(CPU), controller, microprocessor, field programmable gate arrays(FPGA), or other programmable component. The memory 473 includes abootloader 474 for initializing the processor or control module, appcode476 and data storage 478 for program execution. Data 480 (e.g., tables)can reside on non-volatile memory (e.g., non-volatile random-accessmemory [NVRAM] or flash memory) or volatile memory (e.g., staticrandom-access memory [SRAM] or dynamic random-access memory [DRAM]). Thememory for the data 480 can reside in the memory 473 of the processor472 or on an external memory chip. The data can include steering drivercalibration data 482, focus driver calibration data 484, steeringposition calibration data 486, offset values 488, fine adjustment values(or user adjustment values) 490, and tube calibration 496. The steeringdriver calibration data 482 provides adjustments based on steeringdriver circuitry (e.g., steering driver board). The focus drivercalibration data 484 provides adjustments based on focus drivercircuitry or focusing driver circuitry (e.g., focus driver board). Thesteering position calibration data 486 can include position data fordeflection or steering patterns (as shown in FIG. 22). Offset data 488can include calculated values generated during electron central x-raybeam alignment or focus spot alignment, as previously discussed. Fineadjustment values (or user adjustment values) 490 can include additionaladjustments or user adjustments in steering (e.g., position correctionvalues) or focusing (e.g., size correction values). The user adjustmentvalues may be a section of the data can be accessed or changed by usercontrol. The changes to user adjustment values may be small or minor andwell within the safety parameters of an x-ray tube. Tube calibration canbe x-ray tube data specific to an x-ray tube, which may be determined orgenerated during manufacturing of the x-ray tube. The data may be copied(e.g., initially or on each start up) from the x-ray tube or otherwiseprovided (downloaded) to the TCU for the x-ray tube. Data may be storedfor each combination of tube voltage (e.g., kV), tube current (e.g.,mA), focus spot size, temperature, or other relevant x-ray tube ormagnetics parameter.

The control module 470 can extract the focusing parameters from the dataor calculate the focusing parameters based on input. Once focusing dataor values are determined, the focusing data are sent to the focusdrivers 460. The system control unit 430 can send a signal to the TCUindicating that the system control unit is ready to activate the driveroutputs of the TCU. In response to the ready to activate signal, the TCUcommunicates to the system control unit that the x-ray tube and TCU isready for an x-ray exposure. If any errors occur during the process, theerrors can be transmitted back to the system control unit.

To increase speed and responsiveness of steering, position changes maybe transmitted by discrete line to the TCU. In addition oralternatively, the position or steering information can be transmittedthrough a sufficiently fast communication interface. In another example,as shown, the position or steering information can be sent to the TCUand the TCU controls the position or steering changes.

In one example, at the startup of the x-ray system, the TCU 440 canretrieve the different tables or data from memory and combine the datato generate the output signals for the x-ray tube. During this setup,various data (e.g., tube calibration data 496) is combined with thecalibration data for a specified driver 450, 452, 456, 460, 462, or 466.For steering data, the steering data result can then be offset by theoffset data before fine adjustment values 490 (or fine calibration data)are added and merged into final steering data for the specified driver.The final focus or steering data can be stored in the memory 473 andused during the execution of the appcode to generate a focus or steeringcontrol signal (416 of FIG. 8). The final focus or steering data can beregenerated each time the x-ray system or TCU starts up or a value inthe data updated or modified.

FIG. 25A illustrates the generation or combination of focus data 494.Tube calibration data 496 is partially iterated with the focus drivercalibration data 484 to generate the focus data 494. In an example, whenfine adjustment values 490 are available or used for focusing, the fineadjustment values 490 (e.g., size correction values) are combined withthe tube calibration 496 before being partially iterated with the focusdriver calibration data 484 to generate the focus data 494.

FIG. 25B illustrates the generation or combination of steering data. Theoffset value 488 (e.g., for a tube voltage and tube current) is added toeach position of the steering position calibration data 486 andpartially iterated with the steering driver calibration data 482 togenerate the steering data 492. In an example, when fine adjustmentvalues 490 are available or used for steering, the fine adjustmentvalues 490 (e.g., position correction values) are added to the offsetvalue 488 and each position of the steering position calibration data486 before being partially iterated with the steering driver calibrationdata 482 to generate the steering data 492.

Referring back to FIG. 24, combined focus data (e.g., focus tables) orcombined steering data (e.g., steering tables) can be generated from thedata in memory at startup and reside in the data storage of 478 of thememory 473 of the processor 472. The system control unit 430 can be thecontrol unit of the x-ray system used to interface with and controlvarious components of the x-ray system. For example, a system controlunit for a CT scanner can send information to the TCU 440 to setup ascan. The focusing parameters can be dependent on the type of scan to beexecuted, such as focal spot size, tube voltage, or tube current.

Separating the x-ray tube 410 from the TCU 440, as shown in FIG. 8,allows the x-ray tubes and the TCUs to be interchangeable so if thex-ray tube or TCU changes the x-ray tube calibration data 496 (FIGS. 24and 25A) can be uploaded to the TCU without any additional data forcalibration. Data 480 or 478 may be stored on the x-ray tube or the TCUor exchanged between the x-ray tube and the TCU.

Referring back to FIG. 22, the offset value can be applied to adeflection pattern or steering pattern 500, as represented by 1′-8′. Theoffset may be limited by physical structure (e.g., x-ray tube),mechanical properties of the x-ray tube, or deflection position (e.g.,an edge of the imager). For example, the amount of deflection allowedcan be determined by the track width and a throat size of the tube(e.g., in the drift region). The TCU driver design can determine thespeed at which position or steering changes can occur (e.g., offset ordeflection position). In an example, the TCU can steer a central x-raybeam to a position on an x-ray imager in less than 30 microsecond (<30μs). If less deflection is needed, the speed to change position can befaster. The speed for a position or steering change can be determined bythe driver voltage and the amount of deflection needed. The TCU maylimit the amount of deflection based on the driver strength. In anexample, the driver strength may be adjusted or selected for the TCUdesign.

FIG. 26 illustrates offset region 502 with a vertical offset range(limit) 504 and a horizontal offset range (limit) 506 surrounding acentral x-ray beam without offset 508. In an example, the offset rangecan be less than 1 mm. A central x-ray beam with offset 510 can occurwithin the offset region. Based on the physical structure or deflectionposition, the vertical offset range or horizontal offset range on eitherside of the central x-ray beam without offset may not be symmetrical ormay vary from each other.

Focusing can limit the focal spot size, with can be determined by thefocusing magnetics, the focus driver current, the target material, andthe x-ray tube power (e.g., tube voltage and tube current). The x-raytarget (on the anode) may withstand a certain amount of heat densitybefore damage occurs. As a generalization, more power can be utilizedwith larger focal spot.

For both mechanical and electronic tube alignment a reference object,referred to as a phantom (e.g., an alignment phantom or a resolutionphantom), can be used. Alignment can be determined on both rotating andstationary (non-rotating) x-ray systems. It may be simpler to perform aninitial alignment on an x-ray system in a stationary position. On astationary x-ray system, such as a digital x-ray system or mammographysystem, or a rotational x-ray system in a stationary position, thealignment phantom can be a ball, a pin, or a long cylinder placed at thecenter of the x-ray detector. Sometimes, the pin, ball or cylinder iscombined with other features in an x-ray phantom for image quality.However, the function of the pin, ball, or cylinder is similar.Independent of the phantom type, the purpose of the phantom is to alignthe central x-ray beam of the x-ray system with a specified location ofthe x-ray imager (e.g., the center of the x-ray imager). The x-rayimager can include film or an electronic detector. In many cases, othercomponents (e.g., collimator or laser cross hairs) may also be alignedwith the central x-ray beam and the imager. For example, laser crosshairs are often used in patient setup to align the x-ray imager with thepatient anatomy to be imaged. In an x-ray system that is perfectlyaligned, the pin is located directly under the central x-ray beam andthe phantom produces a circle or round spot in the image. If the spot isnot at the center of the imager, another step can be to shift thephantom or x-ray source until the phantom or x-ray source are alignedwith the imager.

If the phantom is misaligned with the x-ray source, the diameter and theratio of the perpendicular diameters may be different. A carefulexamination can also show that the density of the spot or circle is nothomogeneous and has different contrast levels on each side of the spot.The amount distortion or deviation from the actual phantom diameter canhave a direct geometric relation to the offset from the central x-raybeam. The exact amount of offset can depend on the magnification, beamangle, and other factors for the x-ray system.

The distortion or deviation of the image can be visually detected or thedistortion or deviation of the image can be measured in the image usingvarious computer applications or programs. With automation in measuringdistortion in images to determine offset, the electronic central x-raybeam alignment process can generate a final offset value which alignsthe central x-ray beam with the specified location of the imager withinjust a few minutes or less.

FIGS. 27A-B illustrates variations of image dimensions with differencesin x-ray source location. FIG. 27A shows an aligned phantom with x-raysource 520 with an aligned x-ray beam 532 that occurs when an x-raysource 524 is aligned with a phantom 526. FIG. 27B shows a misalignedphantom with x-ray source 522 with a misaligned x-ray beam 534 occurswhen the x-ray source 524 is misaligned with the phantom 526. The imagedimensions 536 (i.e., aligned phantom projected width) of the alignedx-ray beam 532 is smaller than the image dimensions 538 (i.e.,misaligned phantom projected width) of the misaligned x-ray beam 534.

In a stationary x-ray system or rotational x-ray system in a stationaryposition, the phantom is placed at purported center of the detector andan image is acquired. The phantom can be moved until the phantom isplaced at the center of the imager. Once the phantom is centered, theposition of the x-ray source can be adjusted either by the mechanical orelectronic alignment process described. An image is acquired, thedistortion measured, and an offset is calculated, and an electronicadjustment or mechanical alignment of the x-ray source is made. Theconfiguration with the offset adjustment can be verified with anotherimage. The alignment of the phantom with the imager and the centralx-ray beam can affect each other, so the position of the phantom andadjustment of the central x-ray beam may be iterated until a correctalignment between the three components is achieved (i.e., phantom,imager, and central x-ray beam).

FIG. 28 illustrates an example of a ring phantom with a center point 570which includes a ring feature 572 with a center point 574 within thering. The ring phantom 570 may also be used in alignment and can provideadditional information. The center point (spot) 574 can be relativelyflat (as the effect of the distortion decrease with height) with a smalldiameter, which can allow alignment of the phantom with the imager. Thering feature is thicker or higher and produces a distortion or deviationin shape when the ring phantom is not aligned properly with the x-raysource (e.g., x-ray tube). The ring phantom can require less iterationsteps for alignment than some other phantoms.

In rotational x-ray systems (e.g., CT systems), a misalignment of thex-ray beam with respect to the detector and a central axis of the x-raysystem can result in image artifacts, such as streak artifacts.Depending on the amount of misalignment, the image quality can decreaseas streak artifacts become more significant with larger misalignment.During alignment, a phantom with a pin or ball at the center is placedon the couch or table of the x-ray system (near the central axis of thex-ray system) so the pin or ball is centered at the rotation axis of therotational x-ray system. The placement of the phantom can be verified bya scan and examining the artifacts and geometric size of the phantom inthe image. If the phantom is not centered correctly the image can show adistortion. If a stationary image is taken (gantry is not rotating), themeasurements can be similar to a stationary x-ray system to align thecentral x-ray beam with the detector array used on a rotating x-raysystem. In many cases, an offset of as small as ¼ pixel size can be usedto minimize artifacts and increase image quality.

Another method to align the central x-ray beam to the imager, thusimproving the resolution of the image is using line pair phantoms. If acertain separation is not detectable, alignment may not be correct andthe x-ray tube or central x-ray beam may need to be adjusted. Theadjustment can be made until the line pair is distinguishable orvisible. FIGS. 29A-B illustrate examples of different sizes of lineshape phantoms used for alignment or resolution determinations. FIG. 29Ashows three small cuboid shaped line shape phantoms 540A-C. FIG. 29Bshows three large cuboid shaped line shape phantoms 550A-C. The ends (ortwo faces) of the cuboid can have a square shape and each side of thesquare can have length 542 or 552 that is substantially similar to thespace 544 or 554 between the line phantoms. A phantom device may includevarying sizes of line shaped phantoms for different levels or degrees ofalignment or resolution.

FIGS. 29C-E illustrate different images that can result from the lineshape phantoms shown in FIGS. 24A-B, which can be based on precision ofthe alignment of the imager to the central x-ray beam. FIG. 29C showsdistinct and separate line shape phantom images 560A-C, which can be theresult of correct alignment of the imager to the central x-ray beam.FIG. 29D shows a compact line shape phantom images 562A-C, which can bethe result of slight misalignment of the imager to the central x-raybeam. FIG. 29E shows blurred line shape phantom image 564, which can bethe result of misalignment of the imager to the central x-ray beam.

Other mechanisms and phantoms may also be used to align the imager tothe central x-ray beam of the x-ray tube (or central axis of an x-raysystem).

Method of Aligning a Central X-Ray Beam of an X-Ray Tube to a RadiationImager

The flowchart shown in FIG. 30 illustrates a method 700 of aligning acentral ray of an x-ray tube to a radiation detector using a tubecontrol unit (TCU). The method includes the step of emitting electronsfrom an emitter in an x-ray tube, as in step 710. The step of generatingx-rays with a central ray from the electrons colliding on a focal spotof an anode of the x-ray tube follows, as in step 720. The next step ofthe method includes receiving, at the TCU, an offset value representinga distance of the central ray from a specified imager location, as instep 730. The method can further include generating a steering signalfrom at least one steering driver of the TCU based on the offset valuethat is applied to a steering magnetic multipole between the emitter andthe anode on an x-ray tube, as in step 740. The next step of the methodcan include moving the focal spot on the anode with the steeringmagnetic multipole to align the central ray to the specified imagerlocation, as in step 750. At least two poles of the steering magneticmultipole are on opposite sides of a path of the electrons.

The electronic focal spot alignment (or central ray alignment)technology described herein can align a central x-ray beam of an x-raytube to an imager by providing a position or value to the tube controlunit (TCU) to adjust the offset in a specified direction. Whileadjustment of the offset can still be an iterative process, the speed,accuracy, and precision of the adjustment can increase. The precisionand accuracy of an alignment including the electronic alignment can beincreased as the amount of deflection is determined by the electronicresolution. In contrast, mechanical adjustment is limited to themeasuring devices used and the ability of the technician to move thetube accurately. Often the mechanical adjustment in one direction canresult in small translational or rotational motions in anotherdirection, which can degrade or invalidate the mechanical alignment.Accuracy and precision in the electronic alignment can be determined bythe measurement system and the resolution inherent in the electronics,which can be far more precise than a service technician. Sincemechanical adjustment is not required after a course mechanicaladjustment, the process can be automated and can be performed without aservice technician or without a partial disassembly of the x-ray system,as no mechanical access to the x-ray tube and the tube controls may beneeded. The electronic alignment can be performed by a qualifiedoperator on site. For example, an operator may place a test phantom inthe x-ray system and run the automated alignment procedure, which caneliminate a service call to a technician to align the tube or check tubealignment. Alignment checks and verification of x-ray system performancecan be performed at any time and needed adjustments can be made withoutthe involvement of a service technician. In addition, the protectivecovers of the x-ray system may not need to be removed. In one example,the total calibration or alignment time can be reduced from ½ to 1 hourdown to a few minutes.

In addition to the static offset adjustment, the electronic alignmentalso provides a mechanism to adjust for dynamic variations on the x-raytube due to force and thermal expansion or contraction. The electronicalignment described also overcomes challenges from conventional steeringmechanisms and processes. Challenges with conventional steeringmechanisms include a deflection that results in blooming of the focalspot over the range of various tube current and tube voltagecombinations and an increase in focal spot size due to the additionallength of the throat of the x-ray tube (i.e., in the drift region) dueto the added deflection mechanism in the drift region. Other challengeswith conventional steering mechanisms include single sided magnetics,which can cause geometric distortion of the focal spot. The additionalmechanisms (e.g., focusing magnetics and magnetic poles on oppositesides of an electron beam) described can avoid blooming and preciselycontrol the focal spot size and position.

The electronic focal spot alignment (or central ray alignment)technology using a steering or deflection mechanism can be used toincrease image resolution by superimposing a static or dynamic offset tokeep the focal spot in alignment, which can thereby optimize imagequality and reduce geometric distortion. The focusing mechanism in linewith the steering or deflection mechanism can have the additionalbenefit of reducing or eliminating focal spot bloom. Blooming of focalspots can occur due to the increase of the tube current (i.e., higherelectron density or higher current density) and decrease in tube voltage(i.e., lower electron speed). Having an additional focusing mechanismcan control, reduce, or minimize blooming.

Electronic Calibration of Focal Spot Size and Position

The steering magnetics and focusing magnetics of the x-ray tube alongwith the TCU can also provide electronic calibration of focal spotposition (or central ray position) or electronic calibration of focalspot size (focal spot dimensions, central ray intensity, or x-ray beamenergy distribution). In an x-ray tube, the focal spot size can bedefined, in part, by a tube voltage and tube current setting. The focalspot size can change due to electron beam space charge effects atdifferent tube voltages and tube currents. Changing the tube voltage orthe tube current can generate focal spot blooming, as previouslydescribed. Using the steering magnetics or focusing magnetics described,the focal spot size can be adjusted to a uniform size over a dynamicrange of tube voltages and tube currents to avoid the blooming of thefocal spot, which can improve the image quality for the various tubevoltage and tube current combinations.

Conventionally, the deflection (used to generate deflection positions)is generated using a set of tube operation parameters (e.g., a specifictube voltage and tube current). The deflection may only be accurate atthe specific tube operation parameters. At other positions, thedeflection may vary with respect to the focal spot location.

Many x-ray tubes can be used on different types of x-ray systems (e.g.,from different manufacturers). Typically, during x-ray tube calibration,a flat detector is used to calibrate the deflection distance and focalspot size. However, x-ray detectors 240 used in rotating x-ray systemsare mounted on a circular gantry and are intrinsically arc shaped orcurved, as shown in FIGS. 2 and 4-6. The curved shape in the x-raydetector can generate distance differences when compared to a flatdetector, as illustrated in FIGS. 31A-C. Because gantry dimensions, suchas a gantry diameter and a distance of the x-ray detector from the x-raytube, are often unknown to an x-ray tube manufacturer or can bedifficult and expensive to reproduce during a calibration process (withthe gantry), the calibration using the flat x-ray detector can have somedistortions or errors when applied to the curved detector of therotating x-ray systems. The focusing and steering mechanism of the x-raytube along with the TCU can be used to correct for aperture errorsexisting due to the difference in calibration with a flat detectorversus a curved detector on a rotational x-ray system or to adjuststeering or focusing to optimize the imaging results for a specificapplication.

FIG. 31A illustrates an error (i.e., secondary error) in deflectionrange between a deflected central x-ray beam 918 on a flat x-raydetector 306 and a curved x-ray detector 906 (i.e., flat x-ray detectorcentral x-ray beam deflection range 910 and curved x-ray detectorcentral x-ray beam deflection range 912). A secondary error is adifference in focal spot size or position between a flat detector and ausually curved detector on a rotatable gantry. A half of the error 914between a central x-ray beam deflection range on the flat x-ray detectorand the curved x-ray detector is shown on each side of the detectors.Because the curvature of a detector used by specific user is usually notavailable a priori (i.e., before calibration), the focal spot sizes anddeflections can have secondary error. A mismatch of focal spot size anddeflection errors can have a negative impact on image quality and imagesignal to noise.

FIG. 31B illustrates an example of a position error 924 introduced bythe detector curvature. The position error 924 is the difference betweena distance 920 between a deflected central x-ray beam 928 and a centralx-ray beam at a specified reference position 916 (e.g., the x-raydetector geometric center point) on the flat x-ray detector 306 and adistance 922 between the deflected central x-ray beam 928 and thecentral x-ray beam at the specified reference position 916 on the curvedx-ray detector 906.

FIG. 31C illustrates an example of a size error introduced by thedetector curvature. The deflected central x-ray beam 928 is shown withan x-ray beam outline 934 representing x-rays of specified intensity orpower level. The x-ray beam outline 934 can illustrate a change in focalspot size. The flat x-ray detector central x-ray beam size 930 with thespecified intensity (representing a focal spot size applied to the flatx-ray detector) can have a different size from the curved x-ray detectorcentral x-ray beam size 932 with the specified intensity (representing afocal spot size applied to the curved x-ray detector).

As discussed previously, the shift in the position and the change infocal spot size have a negative effect on image quality. Electromagneticdeflection allows for fine calibration of each position for each of thex-ray tube's operating parameters. In an example, referring back to FIG.8, x-ray tube 410, the x-ray detector 420, the system control unit 430,and the TCU 440 form a closed loop system that can be used toautomatically calibrate each central ray position or focal spot withouthaving to return the tube or the TCU to a manufacturer for calibrationand without the intervention of a service technician. The x-ray tube 410in combination with the TCU 440 allows an attached system control unitsystem 430 to adjust and calibrate each position for various tubeoperation parameters, such as focal spot position (or central rayposition) or focal spot size (or central ray intensity or x-ray beamenergy distribution), which can be used to avoid, reduce, or minimizethe introduction of imaging errors (e.g., secondary errors) into theimaging chain. In an example, the calibrations adjustments can beaccomplished at the system level without the need of a service call to atechnician to perform the calibration. As a result, operators can verifycalibration in accordance with their daily, monthly, quarterly,semiannual, or annual quality assurance procedures and recalibrate theimaging chain without the need for a technical service call. In anotherexample, calibration verification can be performed within a few minutesor less and without the intervention of a technician.

FIG. 32 illustrates a flowchart of the electronic adjustment of a focalspot position (or a central x-ray beam position) of the x-ray tube forvarious steered positions 800 (e.g., in a focal spot deflectionpattern), which can be used to correct secondary error. A relativelycoarse mechanical alignment may be performed 600. Then, the electroniccentral ray alignment of the x-ray tube may be performed 620. The imageror detector is exposed to x-rays from the x-ray tube at a deflectedposition 804. The exposure can be performed with an alignment object orphantom. The image of the x-ray detector is processed 806 by a processorin the x-ray detector or the system control unit, and the processorcalculates a position correction (or position correction value orposition adjustment) representing a distance of a deflected central ray(i.e., actual deflected central ray position) from a specifieddeflection position (i.e., the targeted deflected central ray positionwith or without the position correction) 808. In one example, theposition correction represents a 2D distance. In another example, theposition correction represents a 1D distance. The processor determinesif the deflected central ray position (with or without the positioncorrection) is within an acceptable tolerance or precision 810. In anexample, the position correction can have an acceptable tolerance orprecision that is smaller than an offset value used for each of thecentral ray positions. For example, if the offset value can have anacceptable tolerance or precision that is <25 μm (from perfectalignment), the position correction can have an acceptable tolerance orprecision that is <5 μm (from perfect alignment).

If the position correction is not within an acceptable tolerance orprecision, the position correction is added to the steering positionvalue (e.g., used to generate the deflected position) and an existingposition correction (if any) 812. The steering magnetics adjust thefocal spot by the adjusted or corrected steering position value thatincludes the position correction and the detector is exposed with theadjusted deflected central ray 814, and the process repeats until theposition correction is within an acceptable tolerance or precision forthe deflected position. In an example, the position correction can beapplied to the steering magnetics using a steering signal generated fromthe TCU. Once the position correction is within an acceptable toleranceor precision, the position correction can be saved as a fine adjustmentvalue 816. The position correction can be saved in the TCU associatedwith the x-ray tube. In an example, a different position correction canbe calculated with each tube voltage and tube current combination.Referring back to FIG. 22, the deflection position can be calibratedwith the position correction at a position in an allowed or acceptablesteering range 503.

In another example, different position corrections can be calculatedwith each deflection position or steering position (in a deflectionpattern) for each tube voltage and tube current combination. FIG. 33illustrates a central ray deflection pattern 501 (or a focal spotdeflection pattern) showing the eight deflection points 1-8 and theeight deflection points 1′-8′ with offset, shown in FIG. 22, along witheight deflection points 1″-8″ with offset combined with differentposition corrections for each deflection point 1″-8″. Each deflectionpoint 1″-8″ illustrates a different position correction from the otherdeflection points.

In another configuration, the different position corrections can becombined with other alignment values (e.g., the offset value) oradjustment values. FIG. 34 illustrates a position correction region (orfine adjustment region) 512 for central x-ray beam position corrections(e.g., fine adjustment) on an x-ray detector overlaid on an offsetregion 502. The position correction region 512 can be defined by avertical position correction range (limit) 514 and a horizontal positioncorrection range (limit) 516 surrounding a central x-ray beam withoffset 510. A central x-ray beam with offset and position correction 518can occur within the position correction region 512. In an example, theposition correction range can be less than 50 μm. In an example, theposition correction range can be less than 10 μm. Based on the physicalstructure of the x-ray tube or deflection position, the verticalposition correction range or horizontal position correction range oneither side of the central x-ray beam with offset may not be symmetricalor may vary from each other.

For example, if a central x-ray beam with offset 511 (i.e., a differentoffset value from position 510) is on an edge of the offset region 502or the allowed steering range 503, the position correction region 513can be reduced with a smaller vertical position correction range 515 orsmaller horizontal position correction range 517 surrounding a centralx-ray beam with offset 511. A central x-ray beam with offset andposition correction 519 can occur within the position correction region513. In another example, the position correction can be used without theoffset, so a central x-ray beam with position correction 509 can occurwithin the position correction region (not shown).

FIG. 35 illustrates a top view of a curved x-ray detector 906 (FIGS.31A-C) overlaid on a flat x-ray detector 306 (FIGS. 31A-C), whichillustrates the distortion between the flat x-ray detector and thecurved x-ray detector. A flat x-ray detector outline 940 of an image isshown relative to a curved x-ray detector outline 942 of an image and acenter point 916 (FIGS. 31A-C) or 938 on the flat x-ray detector and thecurved x-ray detector. An edge point 944 of a curved x-ray detector thatwas calibrated to a flat x-ray detector can be adjusted, shifted, orcalibrated to shifted edge point 946 of a curved x-ray detector to matcha calibration or an image generated on the flat x-ray detector. Thecenter point 938 may not have a corrected position or an adjustedposition. The rest of the points at other positions (e.g., intermediatepositions) may also be adjusted proportionate to known or measuredcalibrated positions (with position correction). The intermediatepositions can be calculated from the known deflection point corrections.

FIG. 36 illustrates a flowchart of the electronic adjustment of a focalspot size (or central ray intensity or x-ray beam energy distribution)of the x-ray tube for various steered positions 820 (e.g., in a focalspot deflection pattern), which can be used to correct secondary error.The electronic central ray alignment of the x-ray tube may be performed620. The imager or detector is exposed to x-rays from the x-ray tube ata deflected position 824. The detector may be configured to measure acentral ray intensity, x-ray beam power level, x-ray beam energydistribution representing the focal spot size. The measurement can occurat a pixel or a region of the detector. The image of the x-ray detectorwith the intensity or power level is processed 826 by a processor in thex-ray detector or the system control unit, and the processor calculatesa size correction (or size correction value or size adjustment)representing an x-ray intensity difference between the deflected centralray (i.e., actual deflected central ray size) and the central ray at aspecified reference position (i.e., the targeted deflected central raysize with or without the size correction) 828. In one example, the sizecorrection is associated with a tube voltage and tube currentcombination for each deflected position. The processor determines if thedeflected central ray size (with or without the size correction) iswithin an acceptable tolerance or intensity 830.

If the size correction is not within an acceptable tolerance orintensity, the size correction is added to the focusing value (e.g.,used to generate a specified focal spot size) and an existing sizecorrection (if any) 832. The focusing magnetics adjust the focal spot bythe adjusted or corrected focusing size value that includes the sizecorrection and the detector is exposed with the adjusted deflectedcentral ray 834, and the process repeats until the size correction iswithin an acceptable tolerance or intensity for the deflected position.In an example, the size correction can be applied to the focusingmagnetics using a focusing signal generated from the TCU. Once the sizecorrection is within an acceptable tolerance or intensity, the sizecorrection can be saved as a fine adjustment value 836. The sizecorrection can be saved in the TCU associated with the x-ray tube. In anexample, a different size corrections can be calculated with each tubevoltage and tube current combination.

Typically, focal spot focusing occurs before focal spot steering withthe focusing magnetics located before the steering magnetics relative tothe electron beam. If both the focal spot size 820 and the focal spotposition 800 are electronically adjusted, the electronic adjustment ofthe focal spot size 820 can occur before the electronic adjustment ofthe focal spot position 800 (either per position or per x-ray detector).

Although electronic calibration or adjustment of focal spot position (orcentral ray position) or electronic calibration of focal spot size (orcentral ray intensity or x-ray beam energy distribution) is discussedfor position correction and size correction relative to differencesbetween flat x-ray detectors and curved x-ray detectors, the mechanismsand techniques described can be applied to other features that causedistortions and errors. For example, one type of error generated as aresult deflection is the geometric distortion of the focal spot due tothe electron beam impinging on different areas of the curved, angledtarget track surface of the anode, which can cause some distortions anderrors in focal spot position or size. The tube calibration (496 ofFIGS. 24 and 25A) or the steering position calibration data (486 ofFIGS. 24 and 25B) may correct the errors and distortions due to therounded surface of the anode target. In some examples, tube calibrationor the steering position calibration data may not adequately compensatefor the distortions and errors due to the curvature of the anode.Alternatively or additionally, the electronic calibration of focal spotposition and size may be used to provide greater precision to focal spotposition or size and better image resolution.

Combining the processes shown in FIGS. 32 and 36, the electron beam canbe steered to one of the predefined positions and an image is acquired.The image data are processed and respective correction or calibrationparameters are calculated. The process is repeated until the focal spotsize and deflection are within a defined limit or tolerance. Once thefocal spot size and deflection for a particular tube parameter settingis calibrated, the calibration values are stored and the next positioncan be calibrated. The positions may be defined by a user, and as such,the processes described allows the user to tailor or calibrate eachpositions to the imaging techniques the user desires to achieve.

In some examples, the calibration of the focal spot size or position canbe performed in manual mode in which the operator or user commands theelectron beam to a specific position, which in turn causes the x-raybeam to be emitted at a certain position. Data are acquired and thefocal spot size and deflection distance can be accessed, measured, ordetermined. The measured data can then be used to determine the neededadjustments. The calibration process can also be run in an automatedmode allowing the user or operator to make adjustment for theenhancement of image quality without the expense and time of calling aservice technician. By calibration process, individual positions can beoptimized and the parameters used to generate the optimized positionscan be stored in the TCU for use during various procedures (e.g.,patient exams). In an automated mode, applications (e.g., scanner systemsoftware) may be used to control the x-ray detector or extract therelevant information from the x-ray detector or system control unit. Inanother example, the focal spot size error and the deflection error canbe corrected dynamically, such as when the electron beam is moving fromone position to the next position. Electronic calibration of focal spotposition or electronic calibration of focal spot size includes amechanism for adjustment and adjustment verification that can beautomated so the operator or user is able to verify the correct positionand focal spot size without the intervention of a service technician. Ifa recalibration is needed the user or operator can make adjustments orstart the automated calibration procedure to eliminate or reduce thedetected errors.

The adjustments of the deflection position and focal spot size in manualor automated mode allow fine adjustment of the electron beam and cangenerate “optimized” values to correct for aperture errors and otherdeflection errors due to curvature on the detector. Making fineadjustments to the focal spot size or deflection position allows a user(e.g., operator) to correct for distortion errors and can improve imageresolution, the signal to noise ratio, and image quality.

The x-ray tube in combination with the TCU can run an automatedelectronic calibration procedure that includes adjustments of the focalspot position or size. The electronic calibration allows a servicetechnician to optimize image quality during installation or service orenables the user to verify and correct calibrations or redo thecalibrations on site without a service call. The position and sizecorrections can be made throughout the life of the x-ray tube based onuser needs.

The flowchart shown in FIG. 37 illustrates a method 1000 of adjusting acentral ray of an x-ray tube to a radiation detector for variousdeflected positions using a tube control unit (TCU). The method includesthe step of emitting electrons from an emitter in an x-ray tube, as instep 1010. The step of deflecting the beam of electrons with a steeringmagnetic multipole between the emitter and an anode on an x-ray tubeaccording to a specified deflection position follows, as in step 1020.The next step of the method includes generating x-rays with a centralray from the electrons colliding on a focal spot of an anode of thex-ray tube, as in step 1030. The method can further include receiving,at the TCU, a position correction value representing a distance of adeflected central ray from the specified deflection position, as in step1040. The next step of the method can include generating a steeringsignal from at least one steering driver of the TCU based on theposition correction value that is applied to the steering magneticmultipole, as in step 1050. The method can further include moving thefocal spot on the anode with the steering magnetic multipole so thedeflected central ray aligns with the specified deflection position, asin step 1060. At least two poles of the steering magnetic multipole areon opposite sides of a path of the electrons.

All references recited herein are incorporated herein by specificreference in their entirety.

Circuitry can include hardware, firmware, program code, executable code,computer instructions, and/or software. A non-transitory computerreadable storage medium can be a computer readable storage medium thatdoes not include a signal.

It should be understood that many of the functional units described inthis description have been labeled as modules (or units), in order tomore particularly emphasize their implementation independence. Forexample, a module may be implemented as a hardware circuit comprisingcustom very-large-scale integration (VLSI) circuits or gate arrays,including but not limited to logic chips, transistors, or othercomponents. A module may also be implemented in programmable hardwaredevices, including but not limited to field programmable gate arrays(FPGA), programmable array logic, programmable logic devices or similardevices.

Reference throughout this specification to an “example” or an“embodiment” means that a particular feature, structure, orcharacteristic described in connection with the example is included inat least one embodiment of the invention. Thus, appearances of the wordsan “example” or an “embodiment” in various places throughout thisspecification are not necessarily all referring to the same embodiment.

Furthermore, the described features, structures, or characteristics maybe combined in a suitable manner in one or more embodiments. In thefollowing description, numerous specific details are provided (e.g.,examples of layouts and designs) to provide a thorough understanding ofembodiments of the invention. One skilled in the relevant art willrecognize, however, that the invention can be practiced without one ormore of the specific details, or with other methods, components,layouts, etc. In other instances, well-known structures, components, oroperations are not shown or described in detail to avoid obscuringaspects of the invention.

While the forgoing examples are illustrative of the principles of theinvention in one or more particular applications, it will be apparent tothose of ordinary skill in the art that numerous modifications in form,usage and details of implementation can be made without the exercise ofinventive faculty, and without departing from the principles andconcepts of the invention. Accordingly, it is not intended that theinvention be limited. Various features and advantages of the inventionare set forth in the following claims.

What is claimed is:
 1. A method of calibrating a deflected position of acentral ray of an x-ray tube to a radiation imager using a tube controlunit (TCU), the method comprising: emitting a beam of electrons from anemitter in an x-ray tube; deflecting the beam of electrons with asteering magnetic multipole between the emitter and an anode on thex-ray tube according to a specified deflection position; generatingx-rays with a central ray from the electrons colliding on a focal spotof an anode of the x-ray tube; receiving, at the TCU, a positioncorrection value representing a distance of a deflected central ray fromthe specified deflection position; and generating a steering signal fromat least one steering driver of the TCU based on the position correctionvalue that is applied to the steering magnetic multipole; and moving thefocal spot on the anode with the steering magnetic multipole so thedeflected central ray aligns with the specified deflection position,wherein at least two poles of the steering magnetic multipole are onopposite sides of a path of the electrons.
 2. The method of claim 1,wherein generating the steering signal further comprises: summingsteering position calibration data and the position correction value,wherein the steering position calibration data represent current valuesto generate at least one steering position using the steering magneticmultipole for a tube voltage and tube current combination, and eachsteering position has an associated position correction value for thetube voltage and tube current combination; and combining the sum of thesteering position calibration data and the position correction valuewith steering driver calibration data, wherein the steering drivercalibration data represent current values of the at least one steeringdriver.
 3. The method of claim 2, wherein generating the steering signalfurther comprises: summing steering position calibration data, theposition correction value, and an offset value, wherein the offset valuerepresents a distance of the central ray from a specified imagerlocation for a tube voltage and tube current combination, and the atleast one steering position is oriented from relative to the specifiedimager location; and combining the sum of the steering positioncalibration data, the position correction value, and the offset valuewith steering driver calibration data.
 4. The method of claim 1, whereingenerating the steering signal further comprises: determining a positionchange of the central ray different from at least one steering position;calculating an interpolated deflection value using the steering positioncalibration data for at least two steering positions; calculating aninterpolated position correction value using position correction valuesfor the at least two steering positions; and summing the interpolateddeflection value representing a deflected position of the central rayand the interpolated position correction value representing the positioncorrection value of the position change of the central ray.
 5. Themethod of claim 1, further comprising: generating a focusing signal fromat least one focus driver of the TCU that is applied to a focusingmagnetic multipole between the emitter and the anode on the x-ray tube;and narrowing an area of the focal spot on the anode with the focusingmagnetic multipole.
 6. The method of claim 5, wherein generating thefocusing signal further comprises: receiving tube calibration data fromthe x-ray tube, wherein the tube calibration data represent currentvalues to generate a specified focal spot size for the x-ray tube; andcombining the tube calibration data and focus driver calibration data,wherein the focus driver calibration data represents the current valuesof the at least one focus driver.
 7. The method of claim 6, furthercomprising before generating the focusing signal: receiving, at the TCU,a size correction value representing an x-ray intensity differencebetween the deflected central ray and the central ray at a specifiedreference position.
 8. The method of claim 7, further comprising: savingeach size correction value for multiple specified reference positions ina size correction table.
 9. The method of claim 6, further comprisingbefore combining the tube calibration data and the focus drivercalibration data: summing the tube calibration data and a sizecorrection value, wherein the tube calibration data represent currentvalues to generate a specified focal spot size using the focusingmagnetic multipole for a tube voltage and tube current combination, andthe size correction value represents current changes for the specifiedfocal spot size associated with the specified deflection position forthe tube voltage and tube current combination; wherein combining thetube calibration data and the focus driver calibration data furthercomprises combining the sum of the tube calibration data and the sizecorrection value with the focus driver calibration data.
 10. The methodof claim 1, further comprising, prior to receiving the positioncorrection value: receiving, at a system control unit, image data from aradiation imager including a central ray position on the radiationimager; calculating the position correction value based on the centralray position relative to the specified deflection position; and sendingthe position correction value to the TCU.
 11. The method of claim 10,further comprising, prior to receiving the position correction value:detecting x-rays; converting detected x-rays into image data thatincludes the central ray position; and sending the image data to thesystem control unit.
 12. The method of claim 1, further comprising:saving each position correction value for multiple specified deflectionpositions in a position correction table.
 13. An x-ray system,comprising: an x-ray tube comprising: a cathode including an electronemitter configured to emit an electron beam, an anode configured toreceive the electron beam and generate x-rays with a central ray fromelectrons of the electron beam colliding on a focal spot of the anode,and a steering magnetic multipole between the cathode and the anode thatis configured to produce a steering magnetic field from a steeringsignal and at least two poles of the steering magnetic multipole are onopposite sides of the electron beam, wherein the steering magnetic fieldmoves the focal spot of the electron beam on the anode; and a tubecontrol unit (TCU) configured to receive a position correction value andconvert the position correction value to the steering signal, whereinthe position correction value represents a distance of a deflectedcentral ray from a specified deflection position, and the TCU comprises:at least one steering driver configured to generate the steering signal.14. The x-ray system of claim 13, wherein the steering magneticmultipole has a steering yoke with at least two evenly distributed poleprojections extending from the steering yoke and oriented toward acentral axis of the steering yoke and each of the at least two poleprojections having a steering electromagnetic coil operably coupled tothe at least one steering driver that provides a current to eachsteering electromagnetic coil to produce a steering magnetic field. 15.The x-ray system of claim 13, wherein: the steering magnetic multipoleincludes two sets of steering magnetic dipoles that provides twodimensional (2D) steering of the focal spot, and a first set of thesteering magnetic dipoles include two poles on opposite sides of theelectron beam and a second set of the steering magnetic dipoles includeanother two poles on other opposite sides of the electron beam, and afirst path of magnetic flux from between the two poles of the first setof the steering magnetic dipoles is at an angle to a second path ofmagnetic flux from between the two poles of the second set of thesteering magnetic dipoles; and the at least one steering driver includesat least one first axis driver configured to generate the steeringsignal to the two poles and at least one second axis driver configuredto generate the steering signal to the other two poles.
 16. The x-raysystem of claim 13, wherein: the x-ray tube further comprises a focusingmagnetic multipole between the cathode and the steering magneticmultipole that is configured to produce a focusing magnetic field from afocusing signal, wherein the focusing magnetic field narrows theelectron beam on a focal track of the anode; and the TCU furthercomprises at least one focus driver configured to generate the focusingsignal.
 17. The x-ray system of claim 16, wherein the TCU is furtherconfigured to convert a size correction value to the focusing signal,wherein the size correction value represents an x-ray intensitydifference between the deflected central ray and the central ray at aspecified reference position, and the size correction value isassociated with the specified deflection position for a tube voltage andtube current combination.
 18. The x-ray system of claim 17, wherein theTCU includes: focus driver calibration data representing current valuesof the at least one focus driver, wherein the focusing signal includesthe focus driver calibration data partially iterated with a sum of thesize correction value and tube calibration data, wherein the tubecalibration data represent current values to generate a specified focalspot size for the x-ray tube for the tube voltage and tube currentcombination.
 19. The x-ray system of claim 13, wherein the TCU includes:steering driver calibration data representing current values of the atleast one steering driver; and steering position calibration datarepresenting current values to generate at least one steering positionusing the steering magnetic multipole for a tube voltage and tubecurrent combination, wherein the steering signal includes the steeringposition calibration data for the specified deflection position added tothe position correction value for the specified deflection position andis partially iterated with the steering driver calibration data.
 20. Thex-ray system of claim 19, wherein: the at least one steering positioncomprises multiple steering positions; and the steering positioncalibration data includes data for each of the multiple steeringpositions.
 21. The x-ray system of claim 13, further comprising a systemcontrol unit configured to: receive image data from a radiation imagerthat includes a central ray position; calculate the position correctionvalue based on the deflected central ray relative the specifieddeflection position for each deflection position; and send the positioncorrection value to the TCU.
 22. The x-ray system of claim 21, whereinthe x-ray system includes a computerized tomography (CT) scanner or arotating x-ray system and further comprises a curved x-ray imagerconfigured to: detect x-rays; convert detected x-rays into image datathat includes the central ray position; and send the image data to thesystem control unit.
 23. A tube control unit (TCU) configured tocalibrate a deflected position of a central ray of an x-ray tube to aradiation imager, comprising: at least one steering driver configured togenerate a steering signal for at least one steering coil of a steeringmagnetic multipole for an x-ray tube; memory configured to storesteering position calibration data representing current values togenerate at least one steering position using the steering magneticmultipole for a tube voltage and tube current combination; and aprocessor configured to: receive a position correction valuerepresenting a distance of a deflected central ray from a specifieddeflection position of an x-ray imager, generate a deflection valueusing steering position calibration data, and sum the positioncorrection value and the deflection value of the central ray for acorrected specified deflection position, and control the at least onesteering driver to generate the steering signal based on the sum of theposition correction value and the deflection value.
 24. The TCU of claim23, wherein: the memory is further configured to store steering drivercalibration data that represent current values of the at least onesteering driver; and the processor is further configured to combine thesum of the position correction value and the deflection value with thesteering driver calibration data.
 25. The TCU of claim 23, furthercomprising at least one focus driver configured to generate a focusingsignal for at least one focusing coil of a focusing magnetic multipolefor the x-ray tube, wherein: the memory is further configured to: storefocusing position calibration data that represent current values of theat least one focus driver, and store tube calibration data representingcurrent values to generate a specified focal spot size for the x-raytube for the tube voltage and tube current combination; and theprocessor is further configured to: generate a size correction valuerepresenting an x-ray intensity difference between the deflected centralray and the central ray at a specified reference position for the tubevoltage and tube current combination, combine the size correction value,tube calibration data, and focus driver calibration data; and controlthe at least one focus driver to generate the focus signal based on thecombination of the size correction value, the tube calibration data, andthe focus driver calibration data.